Used SHENZHEN AITEXUN ITC-ST212 #293659237 for sale

SHENZHEN AITEXUN ITC-ST212 Final Test Equipment is a advanced semiconductor testing system that can be used to test integrated circuits (ICs). The unit is based on the latest AITEXUN-L45 ITC platform, meaning that it has powerful and reliable hardware performance, capable of rapid testing, high-precision data sorting, and accurate records in the field of high-end semiconductor ICs. The machine supports multiple types of probing tools commonly used with ICs, including socket, spring probe, pogo pin, and vertical probe. It offers simultaneous or stand-alone testing, including wafer, package, and probe-loading devices. The tool has a large IC library, which allows users to rapidly load programs and test ICs from multiple suppliers and product families. The core of the asset is based on the latest version of Trim Test model packaging software, with programming, fixture settings, signal parameters and other settings that allow traceability and flexibility in testing. It can be used to detect signal line parameters such as capacitance, resistance, and voltage. For example, it can detect whether the IC pin level is normal, whether the signal line is open, whether the dc voltage is within tolerance, and whether the signal transients are within the required specification. These features increase the accuracy of the test results. In addition, the equipment has built-in fault diagnosis functions, which can be used to quickly identify abnormalities such as poor contact of test points and broken pins. The system can also detect deviation in a variety of parameters like input/output signal amplitude and impedance. Furthermore, it supports manual, automatic and FPGA programming, making data management and test process more efficient. Finally, the unit comes with key safety protection devices, ensuring high reliability and stability. This includes independent locks for short/open circuit, safety switch for DUT power and signal, real-time temperature monitoring, and monitoring for current and damage. These features make it the ideal solution for high-end semiconductor testing applications.