Used TERADYNE 515-457-A1 #9315339 for sale

TERADYNE 515-457-A1 is a high-performance final test equipment designed for automated production testing of high-complexity semiconductor devices. Built on TERADYNE proven MX platform, 515-457-A1 is designed for inherently reliable and repeatable performance especially when used to test integrated circuits (ICs). TERADYNE 515-457-A1 system is based upon a Windows 10 operating unit and is capable of testing ICs of various form factors including die, chip scale packages (CSP) and quad flatpack (QFPs). The machine is equipped with high-speed parallel data acquisition which provides cycle times of less than 0.75 ms for CSP and 1.0 ms for QFP devices. This is designed to ensure that fast production requirements can be met and exceeded. 515-457-A1 is capable of parallel testing up to 24 devices in parallel, with channel-to-channel skew of <200µs from point of registration. The tool also incorporates full limit administration of each test parameter allowing multiple production set-ups, if required. The asset also provides versatile analysis and operation control for test data review, fault identification, fail-to-pass tracking, and test recipe management, with full network and remote access capability. TERADYNE 515-457-A1 is also equipped with a patented thermal dissipation model for controlling the temperature of devices being tested. In terms of ease of use, 515-457-A1 supports a user-friendly GUI and a wide range of automation features designed to reduce operator time and complexity. This includes the provision of various diagnostic algorithms, statistical analysis and a library of standard waveform formats for testing a wide variety of ICs and package types. TERADYNE 515-457-A1 equipment also provides extensive support for flexible production set-up and test programming. The system supports graphical test development tools designed to reduce programming time, as well as various diagnostic tools designed to provide traceable data and efficient fault isolation. In summary, 515-457-A1 is an advanced final test unit designed to easily meet the production testing requirements of high complexity semiconductor devices. It offers comprehensive features and high-speed performance capable of meeting mid- to high-volume production requirements. It also provides full diagnostic capabilities, flexible programming options and network support for remote access. The machine is an ideal solution for manufacturers looking to achieve efficiencies in their IC test production processes.