Used TERADYNE 805-005-50 #9096750 for sale

TERADYNE 805-005-50 Final Test Equipment is a multi-functional testing platform designed to rapidly test and validate complex electronic assemblies. This next generation platform includes an advanced suite of manual stations for probing, debug, and device conditioning, as well as a broad selection of the highest-performance automated test capabilities available. The system allows for the efficient testing of high pin-count systems with densely packed components, and maximizes flexibility with software-defined configuration parameters and programmable test sequences. On the probing station, 805-005-50 has individual channels for all major test devices, including several test probes with a variety of languages and capability levels. There are high-performance instrumentation options available including Digital Multimeters, LCR Meters, Frequency Counters, and Oscilloscopes. Additionally, devices are automatically identified and all test points are automatically mapped for greater accuracy and faster test results. TERADYNE 805-005-50 also features the latest in test equipment automation technology with a high-speed single-ended test module (SETM). This module provides two 16-channel, analog channels and two digital channels for high-performance device characterization. The SETM is also compatible with a wide range of test device types and supports VXI, LAN, GPIB, and RS232 interfaces as well as custom instruments and integrated production networks. 805-005-50 offers a unique final test solution with its integrated design and feature set. Built with a modular design, the unit can be easily customized to meet any production requirement. As a full-test solution, the machine supports multiple diagnostic and validation techniques, allowing technicians to quickly identify and isolate any design flaws or performance issues. TERADYNE 805-005-50 is designed to provide the most cost-effective and reliable testing available, reducing time to market and providing a uniform output across multiple test platforms.