Used TERADYNE 805-245-50 #9216472 for sale

TERADYNE 805-245-50 is a semiconductor test equipment designed to provide precise detection and testing of higher complexity components. This system offers a high level of test accuracy to ensure components are adequately tested and shipped correctly. The unit is easy to set up and use, allowing for user friendly operation. 805-245-50 machine features a complete test structure with an integrated fully automated handler, making it easy to customize a test solution for a variety of devices. The unique test structure is designed to support a wide range of semiconductor package types, including both small and large package sizes. It also provides the ability to perform simultaneous test programs for multiple arrays. The handler features a high-speed operation with up to 12-site parallelism, providing high-speed throughput and flexibility. The tool has an advanced opto-mechanical assembly that provides best in class accuracy and resolution. The optical asset of TERADYNE 805-245-50 is composed of sophisticated cameras and illumination sources that allow for precise measurements and detailed fault diagnosis. A laser model is also included which delivers improved component measurement accuracy and resolution. 805-245-50 incorporates the best-in-class extended remote controller support to facilitate remote monitoring and diagnosis of tests & faults. The equipment also provides a comprehensive set of debug tools to troubleshoot and diagnose faulty components. TERADYNE 805-245-50 is a robust, flexible and efficient solution for semiconductor testing requirements. It is designed to provide the highest accuracy and repeatability for higher complexity component testing requirements. The system is capable of performing tests at very high speeds, while providing precise data collection and thorough diagnostics. It allows users to easily set up and customize test solutions for a variety of devices and package types. 805-245-50 is a reliable and advanced unit offering high-performance, robustness, and flexibility, for performing complex tests in a final test environment.