Used TERADYNE 805-245-50 #9411157 for sale

TERADYNE 805-245-50 is an automated final test system utilized for inspecting and testing a wide array of integrated circuits and components. It features a modular design that allows it to be tailored to the exact needs of its users while providing high levels of performance and reliability. The system includes a mainframe, a fully programmable set of test head modules, a probe card cart, a conditioning cabinet and a transfer and loading mechanism. The mainframe is capable of testing up to 24 8-bit and 16 16-bit digital devices simultaneously while providing a large data rate of output. It contains an integrated logic synthesizer to design, test and verify logic designs in the field. It can also adhere to JEDEC industrial requirements for analog and digital testing and can be configured with up to ten test head modules. The test head modules are available with a range of instrumentation, signal conditioning and switching capability. They can be used for functional testing, parametric testing, signal loading, functional automation and device analysis. The signal conditioning unit allows available signal sources to be adjusted to the operating power of the device being tested. The probe card cart serves up to three active probe cards and allows them to be connected directly to a device being tested. This allows the user to test multiple probes of digital and analog signals so they can troubleshoot any faults as needed. The conditioner cabinet is a multi-channel signal source that provides clean and stable test signals. The transfer and loading mechanism includes a dual-rail transfer track, vision alignment to ensure accuracy, a scanner for identifying parts, and a receiver for loading parts. The transfer track is capable of up to a 200mm/s transfer speed and provides a smooth and rapid transfer sequence. 805-245-50 is a powerful and versatile final test system that delivers reliable results in all testing scenarios. It can be configured to meet the exact needs of its users, enabling them to quickly, reliably and efficiently test integrated circuits and components.