Used TERADYNE A563-HS #130956 for sale

TERADYNE A563-HS is a state-of-the-art final test equipment engineered specifically for demanding high-speed semiconductor test applications. Boasting several unique features and capabilities, it is the ideal choice when accuracy and reliability are paramount. A563-HS offers flexible test capability, allowing users to customize their test configuration and apply a wide range of test protocols to meet their exact needs. It has a large 1,024-channel system matrix and uses Floating Pin Architecture, allowing for faster pattern speeds with lower load capacitance. This makes TERADYNE A563-HS ideal for testing the latest high-speed microprocessors and other complex devices. Real-time error detection and correction is provided with advanced TwinFlex™ technology, which uses Multi-detect, Disparity Analysis, and Balanced Logic techniques to minimize errors during test, thereby improving yield. A563-HS also provides the highest possible diagnostic accuracy with its Search Level technique, which delivers high device accuracy without sacrificing test time. TERADYNE A563-HS also offers a range of capabilities for parallel testing and programming. These include Multi-Unit Array Testing, allowing for up to four HDRs to be tested simultaneously, which helps to reduce test times. For added convenience and flexibility, there is also an integrated, built-in database and programming unit, allowing end users to store, modify and recall tests. The machine can interface with various types of dataloggers, including bar code readers and other off-line sources, allowing for easy test and data management. In addition, A563-HS offers multiple I/O options, including Ethernet, USB, ATE and SPI interfaces. This provides users with the ability to connect to multiple test sites simultaneously. All of these features, combined with the tool's advanced and reliable test capabilities, make TERADYNE A563-HS an ideal solution for high-speed test applications. Its high accuracy, flexibility, and speed make it the perfect choice for ensuring high device yields and efficient test throughput.