Used TERADYNE A565 #150230 for sale

TERADYNE A565
Manufacturer
TERADYNE
Model
A565
ID: 150230
Tester with WS93.
TERADYNE A565 is a versatile final test equipment that provides cost-effective and reliable test solutions for a variety of products. It is capable of testing a wide range of semiconductor, system and board-level products, such as memory, processors, digital measuring ICs and consumer ICs. A565 unit supports a wide range of processing speeds and power requirements, while simultaneously providing superior performance and cost savings. An advanced digital signal processing (DSP), combined with an innovative sensing architecture, provides an optimized test mix to tackle difficult test requirements. The machine is designed for high future industry requirements, such as flexibility, scalability, and high-speed test capability. TERADYNE A565 tool consists of a unit dedicated to signal processing. This signal processor (SP) handles all the Onboard circuit simulation, RF signal generation and signal conditioning. The asset also supports high speed analog and digital data acquisition, resulting in improved test yield and component quality measurements. Additionally, this model provides high speed logic measurement capability for difficult tests such as strobe or frequency measurements. The integrated controller, the EOS X-Axis, enables the integration of a wide variety of test programs and algorithms. This multi-functioning controller coordinates all test operations ensuring accurate collections of data and test results. The resulting data is sent to the equipment's readout electronics, resulting in an instant interpretation of the test results. A565 system also includes an array of programming options. The unit has an integrated software development environment (SDE) with complete logic, compression and rules-based algorithms. The SDE also allows for hierarchicalcompression andhas the capability to develop custom test functions. TERADYNE A565's digital pattern generator and programmable squelch functionality ensure reliable and accurate parametric testing. The machine is also capable of performing a wide range of parametric tests in a consistent manner, including high speed logic operations. Tool configurations have the option of a wide range of sensing architecture and test requirements. A565 is also equipped with an advanced data analysis and visualization package. This enables the user to obtain a comprehensive overview of the asset performance, while also providing the capability to analyze test results in detail. Overall, TERADYNE A565 is an advanced and cost-effective final test model suitable for a wide range of semiconductor and board-level devices. The integrated digital signal processing, controller, software development environment, digital pattern generator and wide array of programming options allow for a comprehensive, efficient and accurate test platform.
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