Used TERADYNE A565 #293631742 for sale

TERADYNE A565 is a final test equipment designed for applications that require high throughput rates with low cost of test. It offers best-in-class fault coverage for the most demanding digital and mixed-signal test requirements. The system configures up to 44 tester sites with an incredible mix of digital vector, mixed-signal, and temperature controlled tester channels allowing for high-density measurement and test. Each tester site is configurable with a mix of online stations, resources such as disk drives, instrumentation cards, etc. The unit is optimized for high throughput rates with fast FW/SW downloads and multiple concurrent test operations. The I/O connectivity options are flexible and well suited to meet the requirements of a variety of test applications. It supports the latest Atlas Fixturing and the direct access between peripheral devices and testers via the backplane. The machine utilizes a highly reliable operating tool that ensures that tests are performed correctly and results are accurate. Furthermore, device under test (DUT) diagnostics filters and parameters setups can be monitored and adjusted remotely to ensure the best results. A565 also features advanced analysis capabilities to minimize test time, automate fault detection and provide feedback to the manufacturing process. Asset diagnostics helps to ensure that model tuning is constantly maintained and optimization is continuously pursued. Results from tests and analysis can be printed or stored in memory, providing real-time access to test results. TERADYNE A565 is designed for mass production test and is available with a wide range of options for performing electrical, thermal, and mechanical tests. It is equipped with software tools for wafer probe, package and die test and data analysis. In addition to a wide range of upgradeable options, it allows for easy integration of external instrumentation, such as SMUs, PXI, TCP/IP and LabView. A565 is a reliable and cost-effective solution for high volume test applications. Its high throughput rate ensures that tests are performed in shortest time possible, while its high fault coverage provides the highest level of accuracy. The flexibility and the scalability of the equipment make it ideal for multiple test applications.