Used TERADYNE Catalyst BB #9298931 for sale

TERADYNE Catalyst BB test equipment is a state-of-the-art platform designed for semiconductor final test applications. This platform is composed of features that improve throughput and yield, while reducing production costs and maximizing uptime. The testing system includes an agile unit controller, which provides an integrated and scalable architecture for parallel test operations. It seamlessly supports multiple functional platforms, allowing for maximum throughput and flexibility. This machine allows customers to quickly build new tests and easily incorporate them into existing test flows. The tool's high-speed Direct Memory Access (DMA) provides the capability of simultaneous access to multiple memory locations. This eliminates busy loops and enables efficient test scheduling, allowing for higher throughput. To further increase throughput, multi-site test capability allows for simultaneous testing on multiple test sites within a given asset. This allows for parallel test operations and increased throughput. Supporting the model controller is a hierarchical memory structure which combines features of traditional memory and FPGA fabric. This provides a reliable and expandable architecture, capable of addressing high memory requirements and incorporating a variety of test algorithms. Catalyst BB test equipment also has advanced test parallelization capability which provides increased throughput and decreases test times. This allows multiple different tests to be done simultaneously within a single system. The platform is also optimized for ATE productivity, by providing on-board test connectivity, limiting the need for cabling and increasing test time efficiency. Finally, an integrated unit diagnostic feature allows highly comprehensive debugging and troubleshooting capabilities. This allows users to quickly pinpoint and identify errors, allowing them to minimize downtime and maximize productivity. TERADYNE Catalyst BB test machine is a reliable and powerful platform for final test applications. Its high-speed Direct Memory Access, test parallelization capability, efficient memory architecture, integrated tool diagnostics, and on-board test connectivity are all features which provide increased throughput and reliability for production testing.