Used TERADYNE Catalyst LC 55 #293589462 for sale

TERADYNE Catalyst LC 55
Manufacturer
TERADYNE
Model
Catalyst LC 55
ID: 293589462
Vintage: 1999
Testers 1999 vintage.
TERADYNE Catalyst LC 55 equipment is a highly sophisticated automated final test system designed to improve the efficiency and speed of the manufacturing process. It is an ultra-high-speed, multi-function unit for the accurate testing of various integrated circuits, discrete components, and other semiconductor devices. This machine has four five inch wide-area precision conveyors and a small form factor for limited footprint requirements. Catalyst LC 55 tool features a high-speed, high-accuracy vision asset to help identify and inspect components down to the smallest detail. The main part of the model is the Optical Inspection Station which can rapidly and accurately detect the presence or absence of components, as well as measure their precise dimensions. For precise probing of semiconductor devices, TERADYNE Catalyst LC 55 equipment has a high speed electrical test system. This unit is compatible with a wide range of test probes and has a large memory capacity so it can handle huge test programs quickly and accurately. The electrical test machine is designed to locate and track components across the wide area conveyors and test them instantly. The tool is equipped with a number of additional features such as advanced analytics and documentation, automated tray and slotting, automatic feeders and loaders, and data connectivity. Catalyst LC 55 asset also offers multi-site data collection for improved automation and data accuracy. The integrated software allows users to create and manage various test scenarios. The software also controls how data is collected, making it safe and secure. In addition, the model is compliant with the latest industry standards and has optional features such as remote connectivity, advanced reporting tools, automated parameter setting, and more. All in all, TERADYNE Catalyst LC 55 equipment offers an outstanding range of features and benefits for efficient and accurate testing for all types of semiconductor devices. It is an ideal solution for improving the productivity and throughput of any manufacturing process.
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