Used TERADYNE Catalyst #116546 for sale

TERADYNE Catalyst is a highly sophisticated series of final test systems designed to evaluate electronic assemblies. From board-level to equipment-level, Catalyst systems are designed to meet the demands of high-performing and specialized products with high-volume production needs. The system utilizes advanced technologies such as computer-aided design (CAD), computer-aide manufacturing (CAM), and computerized control systems to achieve the highest levels of product performance and quality. Additionally, the unit supports in-circuit, functional, and accelerated stress testing. The machine utilizes a variety of scan test technologies to verify the functionality and integrity of circuitry boards. This includes both analog and digital technologies, such as pin-stretcher, starburster, and current sensing techniques. Moreover, the tool's test algorithm are highly programmable in order to support a wide range of test limits and tolerances. In addition to its scan test capabilities, TERADYNE Catalyst asset integrates a full suite of other test formats. For example, it supports automated optical inspection (AOI), in-circuit test (ICT), boundary-scan testing (BST), and functional-test systems (FTS) to provide comprehensive coverage of production electronic assemblies. The model has been specifically designed to integrate with other factory automation systems. In addition to the data analysis and reporting features, it also has the ability to generate industry-standard test data for interfacing with other systems. To maximize its effectiveness, Caterpillar has been designed with industry-leading reliability. It leverages a robust hardware platform with highly reliable diagnostic tools and industry-standard communications interfaces. What's more, it has a number of software components designed to support timely test program delivery, rapid diagnostics, and simplified maintenance capabilities. Overall, Catalyst equipment provides an extremely reliable and comprehensive solution for final test of electronic assemblies. It provides a wide range of scan test and other test capabilities allowing for high-performance testing with short turnarounds in highest-volume production environments. By utilizing industry-standard hardware and software components, this system has been designed to meet the demands of today's advanced electronic assemblies.