Used TERADYNE Catalyst #9082358 for sale
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ID: 9082358
Test Systems
Tester Cabinet
Power Conditioner
Test Head
Prober not included
Configuration:
#
# Confsim file created on: 01/03/02 09:15:40
#
# Catalyst tester cat9
#
# cat9 is a 1 processor system
# Processor 1: 440 MHz sparc (online)
# PCI based system
# Terabus is present
# Board ID 949-824-00
# Serial number 0276d91
# TCI is present
#
CATALYST_TH 1
BACKPLANE A
#Slot Type Serial # Num XptA XptB Name
2 000-000-00 0x0000000 0 # 23 24 EMPTY
3 000-000-00 0x0000000 0 # 21 22 EMPTY
4 949-658-00 0x80206ad 0 # 19 20 LFAC DUAL CC
5 879-792-01 0x01b9d66 0 # 17 18 TIME CC
6 879-857-01 0x021a0b2 0 # 15 16 PMM CC-01
7 000-000-00 0x0000000 0 # 13 14 EMPTY
8 949-658-00 0x8020638 0 # 11 12 LFAC DUAL CC
9 000-000-00 0x0000000 0 # 9 10 EMPTY
10 949-681-50 0x024a7db 0 # 7 8 VHFAWG400 DIFF CC
11 949-672-50 0x0253ed0 0 # 5 6 VHFDIG CC
14 879-678-52 0x024afca 0 # 25 26 LCA CC
15 000-000-00 0x0000000 0 # 27 28 EMPTY
16 000-000-00 0x0000000 0 # 29 30 EMPTY
17 949-658-00 0x8020636 0 # 31 32 LFAC DUAL CC
18 949-643-00 0x026da57 0 # 33 34 TJD CC
19 000-000-00 0x0000000 0 # 35 36 EMPTY
20 000-000-00 0x0000000 0 # 37 38 EMPTY
21 949-658-00 0x01fc29c 0 # 39 40 LFAC DUAL CC
22 000-000-00 0x0000000 0 # 41 42 EMPTY
23 000-000-00 0x0000000 0 # 43 44 EMPTY
1 949-669-00 0x0269f4e 0 # 3 0 HAS (Left HAS LA669-00)
13 949-668-00 0x0269d27 0 # 0 0 CATALYST HAC
12 949-667-00 0x026a11d 0 # 0 0 DIF
24 949-669-01 0x0269ece 0 # 4 0 HAS (Right HAS LA669-01)
END
RF_PIPES 1
# pipe-name slot schan description
END
#
# Up to 4 Precision AC Card Cages are allowed
#
PRECISION_AC 1
#Slot Type Serial # Num Name
1 949-660-01 0x80251b4 0 # LFACDIG
2 949-659-00 0x8021e87 0 # LFACSRC
3 949-660-01 0x80251f0 0 # LFACDIG
4 949-659-00 0x8023139 0 # LFACSRC
5 949-664-00 0x80120f3 0 # VHFDIG MF
6 949-827-00 0x11d764a 0 # VHFAWG
7 000-000-00 0x0000000 0 # EMPTY
8 949-671-00 0x802120b 0 # PACS CAGE INT
END
PRECISION_AC 2
#Slot Type Serial # Num Name
1 949-660-01 0x8021b1e 0 # LFACDIG
2 949-659-00 0x0253ea2 0 # LFACSRC
3 949-660-01 0x8021b24 0 # LFACDIG
4 949-659-00 0x0254c01 0 # LFACSRC
5 000-000-00 0x0000000 0 # EMPTY
6 000-000-00 0x0000000 0 # EMPTY
7 000-000-00 0x0000000 0 # EMPTY
8 949-671-00 0x802122a 0 # PACS CAGE INT
END
#
# Up to 8 Universal Backplane/Synch Power Subsystem
# cages are allowed
#
# For the Synch Power Subsystem:
# Slot Type Name Instr1 # Instr2 # Ammeter #
#
# Instr1 # - insrument connected to the first two matrix lines
# Instr2 # - insrument connected to the last two matrix lines
# Ammeter # - ammeter connection
# to AVOID errors, put NO 0 if no instrument is connected.
#
#
UB_SPS_CAGE 1
# Slot Type Serial # Num Name
1 879-802-02 0x027c384 0 # UB_SPS_802
2 517-301-00 0x0259f44 0 # UB_APU
3 517-301-00 0x0214dfc 0 # UB_APU
4 517-301-00 0x0259996 0 # UB_APU
5 517-301-00 0x025ce89 0 # UB_APU
6 517-301-00 0x025721b 0 # UB_APU
7 517-301-00 0x027024e 0 # UB_APU
8 517-301-00 0x0257203 0 # UB_APU
9 517-301-00 0x0270237 0 # UB_APU
10 517-301-00 0x027024f 0 # UB_APU
11 517-301-00 0x0256a39 0 # UB_APU
12 517-301-00 0x0256d31 0 # UB_APU
13 517-301-00 0x025720c 0 # UB_APU
14 879-925-01 0x026a03c 0 # UB_60_V_SRC MAT 1
15 879-925-01 0x026c414 0 # UB_60_V_SRC MAT 2
16 879-925-01 0x02484e1 0 # UB_60_V_SRC MAT 3
17 879-925-01 0x0249e11 0 # UB_60_V_SRC MAT 5
18 879-925-01 0x01f0cab 0 # UB_60_V_SRC DUT 1
19 879-925-01 0x024868c 0 # UB_60_V_SRC DUT 2
20 879-925-01 0x026a039 0 # UB_60_V_SRC DUT 3
21 879-690-00 0x02518e8 0 # UB_ASY
22 517-300-01 0x024620f 0 # UB_TJ300
END
HSD100_CHAN_CAGE 1
#Slot Type Serial # Num Fld1 Fld2 Name
1 949-921-50 0x8017a18 0 # HSD CDM 400
2 949-921-50 0x801487e 0 # HSD CDM 400
3 949-921-50 0x80148cb 0 # HSD CDM 400
4 949-921-50 0x8016cf2 0 # HSD CDM 400
5 949-820-10 0x11d8a68 0 # HSD CSB
6 949-921-50 0x80147aa 0 # HSD CDM 400
7 949-921-50 0x8016322 0 # HSD CDM 400
8 949-921-50 0x8014d85 0 # HSD CDM 400
9 949-921-50 0x8016b8a 0 # HSD CDM 400
END
HSD100_CHAN_CAGE 2
#Slot Type Serial # Num Fld1 Fld2 Name
1 949-921-50 0x801421d 0 # HSD CDM 400
2 949-921-50 0x8014e36 0 # HSD CDM 400
3 949-921-50 0x8016c69 0 # HSD CDM 400
4 949-921-50 0x8016cec 0 # HSD CDM 400
5 949-820-00 0x11d7322 0 # HSD CSB
END
CATALYST_TH 1
BACKPLANE B
#Slot Type Serial # Num Name
29 949-626-10 0x801471d 0 # HSD THS
43 949-625-00 0x80201d3 0 # HSD DTH
44 949-625-00 0x80202ed 0 # HSD DTH
45 949-625-00 0x8020264 0 # HSD DTH
46 949-625-00 0x8020229 0 # HSD DTH
47 949-626-10 0x8015548 0 # HSD THS
48 949-625-00 0x8011099 0 # HSD DTH
49 949-625-00 0x801774c 0 # HSD DTH
50 949-625-00 0x802113d 0 # HSD DTH
51 949-625-00 0x80210e5 0 # HSD DTH
61 949-625-00 0x80210bc 0 # HSD DTH
62 949-625-00 0x8020ae6 0 # HSD DTH
63 949-625-00 0x8016f2d 0 # HSD DTH
64 949-625-00 0x80176a5 0 # HSD DTH
65 949-626-00 0x8015cac 0 # HSD THS
66 949-625-00 0x8014a10 0 # HSD DTH
67 949-625-00 0x8016077 0 # HSD DTH
68 949-625-00 0x80160c9 0 # HSD DTH
69 949-625-00 0x802109c 0 # HSD DTH
70 949-625-00 0x80172dd 0 # HSD DTH
71 949-625-00 0x8015140 0 # HSD DTH
72 949-625-00 0x8015f86 0 # HSD DTH
73 949-625-00 0x802021b 0 # HSD DTH
74 949-626-10 0x8012fac 0 # HSD THS
75 949-625-00 0x80210d3 0 # HSD DTH
76 949-625-00 0x8017817 0 # HSD DTH
77 949-625-00 0x80177d6 0 # HSD DTH
78 949-625-00 0x801778e 0 # HSD DTH
END
#
# Trigger Switch Yard
#
# Note: The logical slot numbers below correspond to the physical slot
# numbers only for test systems which contain a TSY card
# cage. In test systems which contain an SCS/TSY card cage the
# mapping is:
#
# Logical TSY slot (below) Physical slot
# 1 -> 2
# 3 -> 1
#
TSY CAGE
#Slot Type Serial # Num Name
1 879-655-02 0x0251831 0 # TSY
2 000-000-00 0xfffffff 0 # EMPTY
3 000-000-00 0xfffffff 0 # EMPTY
4 000-000-00 0xfffffff 0 # EMPTY
END
#
# Time Subsystem
#
TIME_SUBSYSTEM
# Board ID Serial # Name
879-793-00 0x0228EEF # TMS Timer
879-794-01 0x02519F7 # TMS Counter
879-795-01 0x0274CB3 # TMS Support
949-782-00 0x02650AE # Time Mux Board
END
#
# DC Subsystem -
#
# SRC <NUM> [1 - 13]
# (sources 1-5 are MATRIX sources 1-5
# sources 6-13 are DUT sources 1-8)
# HCU <NUM> *[1 - 4]
# REF HCU <NUM> *[1 - 4]
# HVSRC <NUM> *[1 - 4]
# PWRSRC <NUM> [1 - 4]
# DATABITS <NUM> - <NUM> [1 - 192]
#
# ** These instruments share the same seven-slot cage -- only one
# instrument is allowed per slot.
#
DC_SUBSYSTEM
# UBVI 60 1 ( 60V V/I Source in Universal Backplane 1 : slot 14)
# UBVI 60 2 ( 60V V/I Source in Universal Backplane 1 : slot 15)
# UBVI 60 3 ( 60V V/I Source in Universal Backplane 1 : slot 16)
HCU 4
# UBVI 60 5 ( 60V V/I Source in Universal Backplane 1 : slot 17)
# UBVI 60 6 ( 60V V/I Source in Universal Backplane 1 : slot 18)
# UBVI 60 7 ( 60V V/I Source in Universal Backplane 1 : slot 19)
# UBVI 60 8 ( 60V V/I Source in Universal Backplane 1 : slot 20)
SRC 9
DATABITS 1 - 48
# UB_MATRIX
#
# Testhead 1
# XPTs UB Cage Slot Type
# 1-4 1 2 APU
# 5-8 1 3 APU
# 9-12 1 4 APU
# 13-16 1 5 APU
# 17-20 1 6 APU
# 21-24 1 7 APU
# 25-28 1 8 APU
# 29-32 1 9 APU
# 33-36 1 10 APU
# 37-40 1 11 APU
# 41-44 1 12 APU
# 45-48 1 13 APU
END.
TERADYNE Catalyst is one of the most powerful and reliable final test systems available in the market today. It is designed to perform complex test sequences accurately, quickly and precisely. It has been widely adopted by the semiconductor industry for test and validation of integrated circuits (ICs) and other electronic components. The equipment is based on the highly advanced Emulation Platform technology, which enables the system to test multiple devices simultaneously at high speeds with accuracy. It uses a powerful multicore processing power and advanced software solutions, such as Multicore Sequencing, Data Sheet Characterization and Automation (SIM/STT) to fully automate the testing and process flow. Catalyst is a single platform unit which is composed of multiple modules, such as IO modules, Processors, Data Acquisition and Power Supplies. It has a variety of Test Interfaces such as Boundary Scan, JTAG, and I2C to facilitate testing of advanced semiconductor devices. It incorporates advanced features such as Test Windows, Test Parameter Auto-tuning, Test Sequences Tuning, Test Data and Real Time monitoring, Test Filtration and Programmable Power Supplies and it can easily be integrated with existing solutions in an automated environment. TERADYNE Catalyst also provides exceptional diagnostic capabilities with Automatic Test Diagnostics, known as ATDI, which helps detecting hard to find defective components, and it even has an In-Circuit diagnostics (ICD) to trace and analyze failure scenarios in PCBs. The machine also includes a range of Failure Analysis Station (FAS) for further analysis of various components and advanced software solutions such as ScanPilotPro that enable optimized test planning. Catalyst is very efficient and fast, it can test up to 7500 devices per second, and its modern design helps ensure low cost of ownership and better reliability. It also includes an extensive library of test sequences and a wide range of other test solutions, such as Digital and Power Dynamics, as well as advanced software solutions such as Ease Compliance Checker and Signal Integrity Analyzer. TERADYNE Catalyst provides outstanding reliability, low operating costs and exceptional performance, making it the perfect solution for any semiconductor testing requirement. It is the ideal solution for any component testing and validation, helping to ensure the highest quality and reliability of the final results.
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