Used TERADYNE Catalyst #9208664 for sale

TERADYNE Catalyst is a state-of-the-art production test equipment developed by TERADYNE for high-speed final test of semiconductor integrated circuit (IC) products. Catalyst system provides comprehensive test coverage with flexible, modular architecture utilizing high-density board handlers, multiple laser interferometer probe systems, giga-ohm impedance testing, multiple temperature chambers, and integrated tools for visual and auto-inspection. The unit has the capability to quickly identify and isolate defective parts, allowing manufacturers to reduce production delays, lower test costs, and improve product yield. TERADYNE Catalyst utilizes a high-speed, modular, cascaded, multiple-acceleration (MCA) wafer-level test architecture which enables both node test coverage of complex IC chips and production test coverage of all functions of a device. It incorporates a 6 GHz test clock, which provides multi-site high speed tester coverage and high-density memory to ensure that the machine can respond quickly to any test request. Catalyst tool also utilizes a set of in-line and off-line testers to ensure maximum availability of the test equipment and data collection as well as a selection of software packages that allow customers to customize the test asset to their specific needs. The front-end components of TERADYNE Catalyst include a multiple automated handler (MAH) board handler, a multiple laser interferometer (MLI) model, and a variety of automatic test equipment (ATE) racks. The MAH is designed to rapidly test a variety of component and package types, and it provides advanced flexibility to process both standard and custom IC product designs. Additionally, the MLI allows precise coordination between test measurements and helps validate measurements across a wide range of component types. The back-end of Catalyst contains a variety of diagnostic solutions that enable both production test coverage and fault isolation. It utilizes various software packages to help manage and organize complex test configurations as well as an integrated platform of analysis tools for chip-level diagnostics. The platform also includes multiple-temperature chambers, shelf-isolated testers, and giga-ohm impedance testers to ensure robust functional test coverage. Additionally, TERADYNE Catalyst includes digital image-processing tools for automated visual inspection, ensuring the highest quality of IC products. Overall, Catalyst is an advanced production test platform that provides comprehensive test coverage for all types of IC products, enabling customers to lower test costs, maximize time-to-market, and improve product yield.