Used TERADYNE DC30 Board for iFlex #9225466 for sale

TERADYNE DC30 Board for iFlex provides an efficient and cost-competitive final test solution for various memory and logic devices. This equipment offers exceptional accuracy, speed and flexibility which helps improve production by reducing both test time and test cost. The system comprises of a comprehensive test environment, comprising of a test head with unit controller and user interface, power supply, digital pattern generator, high-speed digital storage scope, Voltage/Current source/Measurement Unit, and Thermal Chambers with Machine Controller & Data Collection Module. The tool utilizes the latest and most efficient microprocessor measuring asset to achieve testing with utmost accuracy and speed. The on-board drive test contains high frequency pulse, force response, sweep, and complex transient tests, together with full functional tests. This enables the model to ensure successful development and production of the target device. The iFlex equipment is also capable of handling various memory and logic devices. For example, it offers a powerful and flexible high-speed data acquisition and analysis, as well as on-board pattern generation for testing a wide range of memory and logic devices. The system also has built-in capability to optimize the testing cycle, saving time in the process. The unit is designed for testing high-volume device production and supports a wide range of applications such as embedded systems, and systems with complex configurations. The on-board memory and logic tests are capable of performing various tests, such as signal, timing, and RF tests, with utmost efficiency. Finally, the machine is equipped with high-speed communication tools to extend the testing environment further. This helps the user to connect to remote systems and increase the testing capabilities. The security features of the tool also enable secure data management to protect asset assets. Overall, DC30 Board for iFlex provides a comprehensive and efficient final test solution with its powerful model controller, user interface and data acquisition modules. The built-in features make it suitable for testing a wide range of memory and logic applications. The equipment is capable of offering fast testing, accuracy, and flexibility to ensure successful device production.