Used TERADYNE / EAGLE APU-10 #9190821 for sale

TERADYNE / EAGLE APU-10 is a high-speed, high-accuracy final test equipment designed for applications with mixed-signal and high-speed digital device testing requirements. The system is capable of testing a wide range of digital devices, including microcontrollers, DSPs, FPGAs, and SoCs. EAGLE APU-10 is capable of high-speed test throughput, performing at rates of up to 400 MHz and up to 1000 million transitions (MT) per hour for high pin count devices. The unit is also programmable, allowing for quick changes and updates to test requirements. The machine is built to handle a wide range of signals and devices and is capable of accommodating a variety of package types, such as QFP, BGA, and SOIC. TERADYNE APU-10 includes an integrated library of industry-standard test algorithms, supports real-time debug with an onboard oscilloscope, and has powerful analysis and reporting features. Additionally, the tool includes load board control to help eliminate manual operation errors and increase throughput times. APU-10 offers comprehensive test coverage, providing built-in resources to help ensure the accuracy of test results. The asset is also designed for ease of use, providing a graphical user interface for quick access to all of the model's functions. The equipment can be customized and integrated with a range of third-party software packages, allowing customers to customize their test requirements according to their specific needs. The system is designed with robust manufacturing testability to ensure that the unit is optimized for safe operation in a variety of industrial settings. The machine includes safety features such as a self-test capability and integrated test program validation to help prevent unintentional harm to personnel and the environment. Overall, TERADYNE / EAGLE APU-10 provides high testing performance and a wide range of features to meet the needs of a range of applications. The tool is designed for maximum ease of use and is suitable for applications with high-speed digital device testing requirements.