Used TERADYNE / EAGLE LSI 5 XP / DE #9244793 for sale

TERADYNE / EAGLE LSI 5 XP / DE is a comprehensive testing solution that is designed to meet the needs of today's multi-application electronic systems and their stringent design, performance, and reliability requirements. The equipment combines leading edge test technologies with advanced data analysis capability to deliver high quality results in a single, integrated platform. The system is based on EAGLE LSI 5 XP platform which features the latest in semiconductor test technology, including high speed deterministic test, enhanced diagnostics through wafer and die-level inspection, fast circuit timing data analysis, fault diagnosis, and high performance capabilities. TERADYNE LSI 5 XP platform uses direct probing technology, which minimizes test contactors and enables ultra-fast testing of high-density ICs. The unit can accurately measure component parameters including electrical parameters such as capacitance, resistance, impedance and gain, and non-electrical parameters, including thermal characteristics and signal integrity. In addition, the machine can make real-time measurements of circuit timing behavior (timing skew, setup and hold times). EAGLE LSI 5 XP / DE combines TERADYNE / EAGLE LSI 5 XP semiconductor test platform with TERADYNE LSI 5 XP / DE Detection and Estimation engine. This combination provides precise detections of opens, shorts, and latch-ups, along with full-chip resistance, capacitance, gain, and isolation measurements, as well as signal integrity data. These combinations offer maximum fault coverage and fast diagnostics to help reduce overall test time and improve yield. LSI 5 XP / DE can be used as a stand-alone final test tool or in combination with a wide range of automatic test equipment. This flexibility enables the asset to be tailored to specific customer requirements. The model is compatible with a wide range of industry-standard software tools and design packages, including software associated with the Unified Semiconductor specification (USF) and Standard Test Interface (STIF). TERADYNE / EAGLE LSI 5 XP / DE also offers a host of data analysis capabilities, including reports on fault diagnosis and root cause, yield analysis, and parametric data process control. The equipment facilitates basic statistical methods such as X-bar and R-chart for process and test yield optimization. Additionally, the system has a powerful neural network-based defect detection unit which can detect complex physical defects based on measurements such as capacitance or resistance. In conclusion, EAGLE LSI 5 XP / DE is an advanced and reliable test machine that offers accurate, fast, and comprehensive tests that ensure the highest design, performance, and reliability of electronic systems. The tool is compatible with a wide range of industry-standard software, and provides advanced data analysis capability to help optimize process and test yield.