Used TERADYNE / EAGLE LSI 5 XP #9207174 for sale

TERADYNE / EAGLE LSI 5 XP
Manufacturer
TERADYNE / EAGLE
Model
LSI 5 XP
ID: 9207174
Small digital testers.
TERADYNE / EAGLE LSI 5 XP is a final test equipment designed for testing logic integrated circuits (LSI) or devices in high volume production. It is capable of testing a wide range of digital, analog and mixed-signal semiconductor devices. The system features a high-performance LSPI VersaTester platform which is designed to achieve higher throughput and improve overall test times. The VersaTester allows the user to scale testing complexity with the same hardware by using the PXI Architecture and Xilinx FPGA technology for flexible logic support. This allows for efficient testing of multiple device types on one tester, increasing throughput potential. EAGLE LSI 5 XP unit also offers optional high-speed Programmed Test Access Memory (PTAM) and OCDetect memory options which improve device test time up to 30%. The machine's sequencing technology helps optimize tests and speed successful device testing to more than 600 devices per minute. TERADYNE LSI 5 XP is the latest model in the Eagel LSI family, offering lots of automation capabilities and features that allow for high-volume production at a lower cost. The tool features excellent parallelism for different tests, allowing multiple tests to be executed in parallel to speed the testing process. Additionally, the asset allows for a wide range of formats for different test program definition (TPD) files, enabling efficient handling of various device types without changes to hardware. LSI 5 XP is highly configurable and can be used to conduct both in-line and off-line production testing, enabling testing to be done quickly and accurately. The model's platform is highly reliable and designed for continuous operation, reducing cost and resulting in higher yields. In sum, TERADYNE / EAGLE LSI 5 XP is a reliable and cost-effective final test equipment for high-volume production of LSIs. Its high-performance VersaTester platform, PTAM and OCDetect memory options, and TPD capabilities ensure efficient testing of devices, reducing test times and increasing production capabilities. The system is also highly configurable, allowing users to customize the unit to suit their needs.
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