Used TERADYNE Frame for J750 #9249634 for sale

TERADYNE Frame for J750 is a multi-functional, automated test equipment for the final inspection of electronic boards, surface mount devices, components, chips and hybrids. The J750 incorporates a full range of technologies such as In-Circuit, Boundary Scan, and Vector tests. Frame for J750 has a modular construction and offers the ability to configure systems with up to 27 test points. The system is configured with a high speed, dual transport conveyor with the ability to control packages and profiles up to 11.5" x 11.5". The unit also has two independently controlled XYZ stages, as well as two isolated test section modules with on-board vacuum and manual keying. The machine is designed with multiple auto-run modes so that test protocols can be implemented quickly. The test protocol is tailored to the device under test and its test target. Tests can be performed simultaneously, or in sequence, based on the test requirement. TERADYNE Frame for J750 provides the flexibility of using a wide range of adapters to accommodate the test target fixture. The tool has integrated test coverage algorithms which reduce cycle times for tests, and are automatically optimized for settling times. The open-architecture framework also allows for customization of existing processes as well as test protocols and triggers. The asset features an intuitive user interface enabling an operator to launch and manage tests easily. The model also offers real-time data analysis to determine quality and performance metrics. All test data is tracked and stored on the J750, providing the ability to report and analyze the raw data. Frame for J750 is well suited for manufacturing environments, as it is designed to operate in Class Three clean-room environments. The equipment is also scalable for low to high volume production needs. It is easy to maintain and extremely reliable, resulting in an overall superior test system.