Used TERADYNE iFlex / MicroFlex #9179188 for sale

TERADYNE iFlex and MicroFlex are systems created by TERADYNE for final test applications. The iFlex system is a real-time, wafer-level test platform, designed to deliver the highest test performance and scalability within the semiconductor industry. It offers high-speed testing of devices up to 4096 pins, ultra-low test time, and best-in-class silicon analysis capabilities. The iFlex also features an industry-leading pin-count density and a design that can accommodate a variety of device geometries and package formats. It supports both wafer-level and package-level test and is easily expandable from 1024 to 4096 pins. In addition, the MicroFlex system provides board-level test coverage for printed circuit boards (PCBs) with up to 2048 pins. It offers an innovative architecture that allows for up to 100 analog and digital I/O connected resources serving multiple channels that support up to 12,288 digital multiple I/O pins. It also supports all digital technologies such as embedded processors, microcontrollers, and FPGAs. It features a real-time, architecture that reduces test time and supports both static and dynamic testing, as well as design for test (DFT) and defect-oriented testing. Both iFlex and MicroFlex utilize proprietary digital signal processing (DSP) algorithms that provide high-speed and efficient testing. The iFlex and MicroFlex systems both offer an open architecture, allowing for customization of the system to suit specific customer needs. They both include a suite of tools such as yield analysis, traceability, binning, scripting, and integration with other test systems. Overall, TERADYNE iFlex and MicroFlex systems provide a high performance, cutting-edge test platform for semiconductor and printed circuit board production lines. They offer unparalleled test flexibility, scalability, accuracy, speed, and cost efficiency, making them ideal for a wide range of applications in the semiconductor industry.