Used TERADYNE iFlex #9215606 for sale

TERADYNE iFlex is a comprehensive final test solution for a wide range of semiconductor packaging and device manufacturers. The equipment is modular and configurable, with the ability to accommodate up to six parallel testing boards and up to 32 total pins. It utilizes its advanced TestCell technology for high throughput and repeatability, combined with its traditional in-circuit-testing (ICT) capabilities to support parametric testing, high-pin-count device test, and flexible board test strategies. TERADYNE I-FLEX is designed for rapid test times and high levels of production and yield. The system can perform automatic device programming, multiple-node testing, and dynamic wafer or chip test mapping. Its short cycle times can enable parallel testing, while sophisticated diagnosis capabilities assist with component failure analysis. Additionally, temperature-controlled prober stages allow the control of test point temperatures to ensure more reliable results and repeatability. To speed up and improve the quality of testing, iFlex's analog test feature enables peripheral transistor characterization. Furthermore, its fast oscilloscope measurement capability can run a range of parametric tests such as frequency, voltage, current, power, and more. It also supports stack up measurements on 3D devices for quality control and reliability assurance. The unit comes with an intuitive user-friendly graphical interface that simplifies operations and enhances the debugging process. It includes a database of test parameters, circuit models, and test instructions, as well as a library of test scripts for faster test setup. I-FLEX is equipped with advanced test tools that include an on-board programmable power supply for extended testing flexibility, an integrated oven for burn-in tests, and an operator-selectable device library for turnkey probe settings. The machine also features an up/down motion control tool for handling delicate devices, and a ready-to-go fiber-optic interface asset for embracing the latest technologies. The model is equipped with a range of high-end software tools for complete parametric and functional test coverage, including a built-in model-based test development tool for custom test development. It also supports the virtual resources necessary to support advanced optical and RF tests. The equipment also includes an Intense Diagnostics Suite™ that helps pinpoint device failure points quickly, and a Quality Assurance (QA) software suite for die-level data collection and presentation.