Used TERADYNE iFlex #9258390 for sale

TERADYNE iFlex is a high-performance, flexible solution for the final test of high-component circuits. It is designed for both organic and synthetic multi-chip modules, BGA's, and components down to the 0201 drags. It offers test methodology such as Automatic Test Pattern Generation (ATPG) and Structured Built-in Self Test (SBIST) to achieve the highest yield and quality standards in today's market. TERADYNE I-FLEX utilizes its own proprietary architecture, iFlex Ultra Fast Detect (iF-UFD), to enhance test sensitivity and to minimize test time. iF-UFD combines pattern generation, high-speed MUX control, and low-voltage differential signaling (LVDS) technologies to detect subtle pin states in electrically noisy environments. It also features Dual-Column Architecture for driving, capturing, and low-visual feedback of test signals and preconditioned exercise algorithms for optimizing test signals and special hardware functional test architectures for supporting a wide variety of tests. I-FLEX supports a wide variety of complex test methodologies, including parametric measurables, functional-level tests, node-based bridging, multiresistor networks, advanced math functions, etric multi-gauge, and image recognition. In addition to these powerful test strategies, the system also features an intuitive system design and operation. The user-friendly operation and the built-in boot-up capabilities enable operators to find and begin preparing for their tests very quickly. TERADYNE iFlex is versatile and cost-efficient, allowing for high-volume, low-cost testing and re-testing of high-complexity parts. It also offers a wide range of accessories to meet customer needs. Additionally, TERADYNE I-FLEX's test support capabilities enable the instrument to analyze trends in test data and identify areas of process deficiencies. These capabilities help ensure product quality and compliance with industry standards. In conclusion, IFlex is a high-performance, flexible solution for the final test of high-component circuits for organic and synthetic multi-chip modules, BGA's, and components down to the 0201 drags. It offers a wide variety of test methodologies and features intuitive system design and operation, making it an ideal solution for high-volume, low-cost testing and re-testing of high-complexity parts.