Used TERADYNE IP 750E #9213048 for sale

Manufacturer
TERADYNE
Model
IP 750E
ID: 9213048
Tester 512 Pins Includes: TERADYNE IA-OPT 385 Illuminator Light source Boards: CUB (4) HSD100 (4) ICUD DSP Workstation: XW6000.
TERADYNE IP 750E is a high-performance testing system used for efficient final testing of integrated circuits, known as ICs. IP 750E is tailored for best-in-class high-volume production testing and has the ability to test a wide variety of products, including SoCs (systems-on-chip), consumer and automotive ICs, processors, and memory components. TERADYNE IP 750E offers a significant reduction in cost-per-test by providing a complete suite of pin-level access. It is able to test most ICs and all types of integrated components including, but not exclusive to, discrete components. The configuration allows users to cover the full spectrum of IC testing from single-pin devices to high-pin-counts. IP 750E is designed to provide the highest throughput possible. This is accomplished by using the advanced structural test algorithms, such as looping, multiple pattern execution, C-limit testing, and improved memory registration capabilities. Also, it provides users with adaptable algorithms for test optimization and streamlined programming. TERADYNE IP 750E offers user-friendly graphical programming tools to make test comprehension and job set up easier. It also has an intuitive user interface, so that anomalies can be quickly identified and solved. Furthermore, with in-built statistical analysis, IP 750E can detect even the most subtle deviations in signal requirements and can detect transient anomalies quickly. TERADYNE IP 750E also provides improved diagnostics through its advanced fault isolation capabilities. It offers isolated node tracing, voltage test probing, bus analysis, and characterization of fault emission. These capabilities enable enhanced fault coverage while reducing the need for iterative testing and other manpower resources. Overall, IP 750E is a highly reliable final test system, designed to provide quality test results with decreased cycle times, higher throughput, and greater accuracy. It features a dynamic architecture that moves easily from tester to tester with the same setup, making it a great choice for high-volume production testing.
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