Used TERADYNE J750 E #9031870 for sale
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ID: 9031870
Vintage: 2002
Tester
Converted from IP 750
192 CH
(2) HSD, 50 MHz, 8MLVM
(2) ICUD
(1) DPS
(1) ITOS-750 illuminator
(1) P8 probe station with hinge manipulator
#slot[.subslot] Type idprom (type rev company)
-1 sli 239-624-00 9846-A 5445
0 channel 239-026-03 0603-E 5445
0 icud 517-429-00 0439-A 5445
1 channel 239-026-03 0603-E 5445
1 icud 517-408-01 0407-0 5445
2 channel 239-026-03 0603-E 5445
2 icud 517-429-00 0439-A 5445
18 cub 239-020-07 0541-D 5445
22 dps 239-016-06 0702-F 5445
23 dps 239-016-03 0425-D 5445
2002 vintage.
TERADYNE J750 E is a next-generation, high-performance final test equipment used in production test for high-speed printed circuit board (PCB) manufacturing. The platform consists of highly automated components such as a high-speed wafer sort system, a Universal Socket/Multi-DUT electrical test unit, conveyors, and robot arm integration, all working together to enable higher throughput, accuracy, higher quantities, and improved quality. The high-speed wafer sort machine is designed for a variety of test types, including burn-in, component mass probing, and PCB functional tests. It rapidly handles a wide range of measurements for each test, such as voltage, current, power, and resistance, as well as numerous parameters. It also features an enhanced software package that includes test sequencing with indexing, advanced fault diagnostics, manual and automated device programming, and more. The Universal Socket/Multi-DUT Electrical Test Tool offers throughputs of up to 60,000 DUTs/hr, 24/7. It maximizes test coverage with hundreds of tester sockets, quickly switching between types with minimal downtime. This asset architecture is designed to keep tests running quickly, and to handle both newly released and mature products. Compared to automated vision test systems, it is able to handle a much larger variety of parts, including difficult-to-test components such as LEDs and BGA packages. The model comes with many integration options, such as a linear transfer module, indexing conveyors, and an automated carousel. This allows TERADYNE J750E to seamlessly link into features such as an automatic library loader. Additionally, integration of robots enables complex tests such as component placement and e-test probing. For flexibility and scalability, J 750 E has multiple processing PCs with a comprehensive software suite. This enables multiple operators to simultaneously control and monitor various aspects of the production line. The equipment also offers comprehensive connectivity, including support for OPC server, SNMP, and IEEE 488.2. In sum, TERADYNE J 750 E is a final test system designed to offer high-speed testing for superior throughput and accuracy. Its wide range of components and integration options enable it to work with a wide variety of tests and components. Plus, its modular architecture makes it easy to scale for changing production needs. J750 E is the perfect solution for any production testing or validation needs.
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