Used TERADYNE J750 E #9256207 for sale

TERADYNE J750 E Final Test Equipment is the latest series of high-speed, low-cost wafer and component test solutions from TERADYNE. It is an integrated circuit (IC) test system specifically designed for high-volume, high-performance production testing and crash testing of semiconductor products. This device tester incorporates a number of advanced technologies, such as advanced unit diagnostics, dynamic test scheduling, and mixed-voltage control to provide chip makers, machine designers, and test engineers with an efficient solution for testing a wide range of IC types and configurations. TERADYNE J750E is capable of testing circuit boards, ICs, and other components up to 800 MHz, at up to 10 Terabits per second and with a maximum of 1 million instructions per second. It is an integrated tool, comprising of the mainframe, test head, EPM, and various supporting tools. The test head is designed to provide flexible and powerful testing capabilities, making this test asset well-suited for production environments. Its on-board digital I/O enables testing of mixed technologies, such as RFID, LTE, and other high-speed interfaces. It also supports mixed-voltage control, allowing mixed-voltage testing in a single test run, allowing greater efficiency. J 750 E features a user-friendly graphical interface, allowing users to customize testing routines and displays. The model has a built-in Linux-based server, which provides a secure environment for equipment configurations, data acquisition, and remote test control. It also uses intelligent, built-in algorithms to better predict and optimize test outcomes, reducing the risk of false errors and reducing system downtime. J750 E Final Test Unit is designed to meet the needs of high-volume semiconductor production lines. It is an integrated, high-speed and low-cost test solution, providing a comprehensive and intuitive solution for production testing and crash testing of semiconductor products. It eliminates the need for multiple test systems and reduces time spent on test setup and execution, providing a much more efficient method of testing.