Used TERADYNE J750 E #9256208 for sale

TERADYNE J750 E
Manufacturer
TERADYNE
Model
J750 E
ID: 9256208
Vintage: 2008
Tester 1024 Pins (8) HSD100 (4) DPS XW8400 Workstation 2008 vintage.
TERADYNE J750 E Final Test Equipment is one of the most advanced, reliable, and user-friendly test platforms on the market today. TERADYNE J750E is an ultra high-density production test system designed for efficient and cost-effective testing of today's most advanced semiconductor devices. It provides ad-hoc test solution and cost-effective on-wafer probing, due to its integrated prober capability and advanced hardware features. J 750 E final test unit has one of the industry's highest device test capacity for high-volume production test. It can deliver at least 3000 test channels (additional channels with chipset enablement) at 30 MHz burst data rate per channel, with 40Gbps data streams and 1μs response time. The machine utilizes available performance more efficiently through the use of highly parallelized platform featuring 32 data nodes, each with its local RAM repository, providing massive parallelism, feature scalability and high-performance test options. In addition, J750E test tool includes integrated parallel software tools for efficient device debug and diagnosis. These include Visual DFT, for highly visual user-oriented debugging and real-time, on-wafer interactive probing. Also included is WLC Design Automation Software used to generate high level test programs from a graphical environment and using the IQ Fusion platform for automated creation of WLC (Wide Language Compilers). The platform also integrates the Quantum Verifier (QV) for extremely fast and reliable test time cycle, using embedded Vector Utilization (EVU) technology. The QV ensures fast time to market for new products, while providing a completely automated and hands-free test solution. In addition, the asset is supported by asset management, that reliably tracks and monitors fabricated wafers and retests as needed. This helps to ensure no missing or incorrect testing occurs. Finally, J750 E final test model is more cost effective to expand, thanks to its open architecture design and a high density 'switchable' Multi Test board which offers flexibility for different package types and port configuration. TERADYNE J 750 E final test equipment is a powerful and reliable solution for testing the most advanced semiconductor devices available today. With its integrated features such as Visual DFT, WLC Design Automation Software, IQ Fusion, Quantum Verifier, as well as asset management, this streamlined testing system ensures maximum efficiency and cost-effectiveness.
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