Used TERADYNE J750 E #9265119 for sale

Manufacturer
TERADYNE
Model
J750 E
ID: 9265119
Vintage: 2006
Tester 1024 Channels test head CUB Board (4) HSD100 16M Channel boards (2) DPS Power conditioner 2006 vintage.
TERADYNE J750 E is a menu-driven, flexible, and robust final test equipment from TERADYNE. This system is capable of testing multiple devices simultaneously while also providing real-time device monitoring. This makes it suitable for high-volume production testing and device characterization. TERADYNE J750E unit contains a fast PC-based, multiple core processors, industrial motherboards, Gigabit Ethernet connection and interfaces for multiple device types. The machine facilitates simultaneous testing of components and their functioning. A powerful graphic interface allows easy navigation of multiple testing options with a simple push of a button. The tool supports a range of test methods, such as functional test, serial IO test, boundary scan, as well as voltage, parametric, and optical measurements. The onboard memory asset of the model together with the tested items' buffering capability helps in saving the test results in case of power loss. This also helps in ensuring a non-interrupted test in long design cycles. The equipment also enables quick and easy data transfer along with the report generated, which can then be used for device characterization and analysis. A path-controlled feature can also be used to enhance the overall performance of the system. This feature allows the testers to create pathways through the boards and thereby increasing the speed of the production process. J 750 E has robust, self-learning software that helps testers to easily configure the test parameters in no time and without any hassle. This unit is also capable of handling all types of manufacturing environments, ranging from NPI (new product introduction) to production floor testing. Overall, J750E is a highly integrated machine and therefore ideal for high-volume production tests. The flexible and robust tool can be used to test different device types quickly without any interruptions. Moreover, the asset's powerful graphical interface and path-controlled feature allow for faster production cycles.
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