Used TERADYNE J750 E #9267899 for sale

TERADYNE J750 E is a specialized final test equipment designed for a variety of applications ranging from semiconductor wafer to packaged components for consumer electronics. The system features an advanced 5-axis motion platform for high speed, high accuracy testing of small and large packages at a wide range of test angles. The unit is designed to provide precision test performance, high test throughput, and reliable, repeatable measurements for a variety of component types, including digital, analog, RF, and opto-electronic components. TERADYNE J750E utilizes advanced 3D Computer Aided Design (CAD) capabilities to generate custom test diagrams that adapt to components of various sizes and shapes. It features both vertical and horizontal test bays that provide efficient testing and enhanced throughput for higher production rates. The machine is also equipped with a high resolution CCD camera for improved accuracy, and powerful probe motors that enable extremely accurate probing. J 750 E also features a powerful DSP-based control tool with adaptive test algorithm technology for maximum flexibility and high accuracy test measurement. The test asset is equipped with a variety of connectivity options for secure remote access and monitoring. The model is also capable of interfacing with a variety of test sets, including pin-state testers, network analyzers, and logic analyzers. TERADYNE J 750 E also offers advanced diagnostics and traceability capabilities to support automatic diagnostic reporting, and integrated data recording for traceability and diagnostics tracking. The equipment also includes a dynamic programming package with the latest language versions for high flexibility in programming and test protocols. This allows for the seamless integration of new devices and features for higher efficiency. The system is designed for use in a variety of high-reliability industries such as aerospace, automotive, medical, and industrial manufacturing. J750E provides consistent test results for high-complexity, reliable devices. Its robust design and integrated features make it an ideal choice for final production testing and quality assurance.