Used TERADYNE J750 EX-HD #293595331 for sale

TERADYNE J750 EX-HD is a final test equipment designed to meet the needs of high-volume production testing and to address the challenge of increasing device complexity. It provides flexible, high-performance testing and reliability results with its advanced test algorithms, expandable test platform and high-level software integration. This system is optimized for final functional testing of digital, high-speed, and mixed signal devices, such as FPGAs, microprocessors, and digital ICs. TERADYNE J750EX-HD utilizes TERADYNE E6 test architecture, based on a scalable architecture that allows for testing a wide range of device types. The Enhanced Digital Examiner (EDX) within the architecture ensures that J 750 EX HD meets the requirements of the latest state-of-the-art test techniques. This unit also supports multi-site parallel testing, or T-mode, which allows for simultaneous testing of multiple devices on multiple tester sites, enabling high-speed parallel testing of FPGAs, processors, and ASICs. The expandable, re-configurable test platform allows the user to easily expand their test capabilities to match the level of complexity of their applications. The machine is also designed to meet the needs of high-volume production test environments, with features such as high test programmable throughput, repeatable test processes, and automated fault placement. Additionally, this platform includes a range of plug-and-play, integrated controllers and test headswith advanced test management capabilities, providing efficient and reliable test results. The software integration capabilities of the tool include user-friendly, interactive programming, analysis and debugging tools for test development. The asset also offers remote control through an embedded web server, as well as remote calibration and maintenance capabilities. This allows for remote access and control of the model, as well as remote diagnostics, troubleshooting and repair. J750EX-HD is designed to provide reliable and accurate test results, while optimizing test costs, to support the requirements of high-volume production testing and to address the challenge of increasing device complexity. This equipment offers advanced test algorithms, expandable test platform and high-level software integration capabilities that enable users to address these challenges while maximizing test throughput and accuracy.