Used TERADYNE J750 EX-HD #293824669 for sale

TERADYNE J750 EX-HD
Manufacturer
TERADYNE
Model
J750 EX-HD
ID: 293824669
Tester.
TERADYNE J750 EX-HD is a fully automated test equipment designed for high performance final test applications. This system is capable of hosting a variety of medium and high-complexity test programs with features and performance that are ideal for both high-end semiconductor testing and aging/failure analysis. This unit provides advanced capabilities to handle today's high-volume production test needs as well as the exhaustive data analysis required for high technology device failure and defect analysis. At its core, TERADYNE J750 EX-HS is an advanced test platform that is capable of running a variety of test protocols including ATE, functional and failure analysis. This machine's hardware components include an Open Fire Series mainframe with four Industry Standard Open Chassis for wide tool expansion. This asset has 4 10-bit high-precision analog channels, 80 logic channels, and a 16-bit digital bus interface. Additionally, a VME IO processor, Global Alignment Model, Network Interface and four PMI2 IO cards are included in the equipment for enhanced performance with optional high-end plug-in modules. A wide selection of libraries, utilities, and software tools are available to fully support TERADYNE J750EX-HD system. These include software packages for assembly, integration and testing of many different technology types, including C, C++, VHDL, Unit C, Verilog, and a wide range of test scripts. Test flow programs are also available for advanced test scenarios such as AC and DC characterization, Mixed-signal Off-Line Test and Production Test. J 750 EX HD also includes Advanced Exception Handling, built-in DFX, Secondary Exception Handling, Smart DUT Fixturing, and Dynamic Fault Generation. The features of TERADYNE J 750 EX HD make it an excellent choice for semiconductor high-end testing and failure analysis. This machine is designed to maximize productivity, accuracy and efficiency when testing the most challenging devices. It saves time and money by eliminating redundant or wasteful processes and provides advanced capabilities like high-precision and dynamic fault generation to run complex and custom test scenarios. With its powerful hardware and a wide selection of software tools, J750EX-HD provides an efficient and reliable solution for high-end test and failure analysis.
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