Used TERADYNE J750 EX-HD #9223829 for sale

TERADYNE J750 EX-HD is a comprehensive final test equipment designed to meet the challenges of high density production environments. It is suitable for a variety of active device types, including microcontrollers, memory devices, logic devices, data converters, radio frequency (RF) devices, and discrete components. The system is capable of testing devices with high pin counts and nodes, with pin speeds up to 9ns. Additionally, TERADYNE J750EX-HD is designed with a bandwidth of 2.2GHz, making it capable of high speed testing. J 750 EX HD comes with both a pin station module (PSM) and a digital signal processor (DSP). The PSM provides testing services for device pins, offering advanced voltage and CDM sensing and testing. The DSP is capable of providing high speed reaction time tests, as well as providing the capability to create, analyze, and store test results. TERADYNE J 750 EX HD is equipped with an expandable high density test head, with an array of pins, giving the user the ability to quickly and easily create tests for any active devices. The unit includes ISD services, which allows up to 8 simultaneous tests, and can be upgraded with additional parallel testing capability. For a production line, J750 EX-HD is also equipped with an ergonomically designed test handler interface. This allows for easy access to test heads, device handling, and operations, all from a single user interface. Additionally, the machine supports optional camera capabilities, allowing the user to verify progammed patterns and perform visual inspections on device under test. J750EX-HD also includes an integrated test executive (ITE) environment. This environment allows for the design, execution, control, and analysis of tests at a macro level. The tool also includes verification tools, such as the logic analyzer and fault locator, which allow for quick debugging and trouble-shooting. TERADYNE J750 EX-HD also comes with extended serviceability features, making it easier to maintain and monitor test systems. Finally, TERADYNE J750EX-HD offers real-time data collection and analysis. This allows the user to monitor yield performance and quality trends on a device-by-device basis. Additionally, the asset is equipped with a variety of model security features, including a secure, encrypted LAN connection, and password protection for all administrator accounts. In sum, J 750 EX HD is an advanced final test equipment designed for high density production applications. It is capable of testing devices with high pin counts and throughputs, with extended serviceability features and enhanced security measures. With its ergonomic test handler interface, and versatile analysis tools, TERADYNE J 750 EX HD is an excellent choice for production line testing.