Used TERADYNE J750 EX #9178166 for sale

TERADYNE J750 EX is a final test equipment designed to meet the testing and debugging requirements of high speed, complex ASICs (application-specific integrated circuits). With its patented vector-based pattern calculation engine and ultra-fast test speed, TERADYNE J750EX is ideal for testing and debugging next-generation digital ICs. J 750 EX operates in a modularly configurable, automated test cell environment, with all network connected components and systems managed through an intuitive, user-friendly software interface. The main test system core is composed of mainframe unit, a control board, a configurable probe card, and a logic module. The mainframe machine is composed of nine test stations and two dual-port network interfaces which allow for expansion and connection to additional devices. The mainframe also supports four drive-by connections, making it easy to connect and configure other components in the tool. The control board is the key to J750EX's advanced features. This includes powerful programmability and test sequencing capabilities. The control board also contains a built-in vector-based pattern calculation engine that produces highly reliable fault coverage measurements. The configurable probe card and logic module provide the necessary hardware to connect your test and debug systems to TERADYNE J 750 EX. J750 EX's simulation capabilities are highly advanced, with the ability to create real-time simulations of circuits in order to reduce test time and enable faster resolution of failure points. TERADYNE J750 EX can also execute tests to collect information for code coverage analysis. This asset also supports mixed-signal debugging capabilities, providing insight into both digital and analog components. Additionally, TERADYNE J750EX offers concurrent multi-site test capabilities, allowing the user to execute tests on multiple sites simultaneously. In short, J 750 EX is a powerful and comprehensive final test model designed to test and debug the most advanced and complex ASICs on the market. With its vector-based pattern calculation engine, real-time simulations, mixed-signal debugging, and concurrent multi-site testing capabilities, J750EX is an ideal solution for any high speed, highly complex ASIC testing requirements.