Used TERADYNE J750 EX #9206967 for sale

TERADYNE J750 EX is an advanced Final Test Network equipment designed to meet the extreme test requirements of today's complex system-on-chip (SoC) products. With its modular platform and flexible architecture, it provides the highest available throughput and productivity levels of any Final Test Network unit available. It can be used to test a variety of products from PCs to network attachments, and comes with a variety of features to ensure the highest quality test results. TERADYNE J750EX features a versatile modular platform, which house the machine's components, including SLM systems, direct-attach components, test scanning probes, and AC/DC power supplies. These components are housed in a single, highly-configurable control cabinet, with a low overall height. This allows the tool to be used in many different test applications. Additionally, the asset utilizes a FlexFrame architecture. This allows for high throughput and scalability. The model also supports up to 1400 pins per equipment, with support for up to 16K devices and 16K fault sites. It also features a distributed control system and integrated connection management to reduce the number of wired components required. J 750 EX is also designed for high accuracy and reliability. It utilizes advanced test control features such as discrimination, probe cycling, process callouts, and look-ahead testing. This ensures that the unit tests for all applicable signals and functions, while still providing precise and accurate results. The machine also supports a wide range of test paradigms, including Boundary Scan, Functional Test, LEB (Logic Element Boundaries), Structural Test, and Scan Insertion. This wide range of test paradigms ensures that the tool can accurately test a variety of product types. J750 EX is also equipped with J750EX programming language. This language is designed to simplify test program debugging and maintenance. It is also used for the creation of customized test programs. This makes test development significantly easier and more efficient. In addition, the asset includes a comprehensive software package. This includes tools for pattern authoring, vector loading, fault prediction, visualization, and other features. This allows for the creation of high-complexity tests, which may be required for advanced SoC products. Finally, TERADYNE J 750 EX is supported by a wide range of mechanical and environmental test accessories. This includes everything from temperature and humidity chambers, and automated wafer mapping, to vibration and shock testing equipment. This ensures that the model is versatile and can be used for any application.