Used TERADYNE J750 EX #9223376 for sale

TERADYNE J750 EX is a fully automated final test equipment that offers industry-leading flexibility, speed, accuracy and reliability for production floor operations in semiconductor, electronics and automotive industries. The system is capable of testing multiple product types, ranging from low- to high-volume integrated circuits and components. TERADYNE J750EX is equipped with advanced hardware components to maximize unit performance, including an Intel Core i7 processor, 48 GB DDR4 RAM, TERADYNE Proprietary ASIC cards, as well as high-speed PCIe and USB connections. J 750 EX supports both parallel and serial testing, making it an ideal candidate for high-volume, complex applications. The machine has an integrated, own designed adaptive, interpreter-based testing &result analysis(T&RA) tool, powered by TERADYNE SIFT Tool suite, which delivers faster test time and an improved algorithm for fault detection and diagnosis. It comes with an open architecture, which allows for easy integration of custom test modules and debugging tools. J750 EX offers several advanced features, including "smart debug" capabilities for rapid diagnosis of failing parts. This toolset is designed to detect common physical defects earlier and easier, leading to improved yield rates and lower replacement costs. TERADYNE J 750 EX also supports a full suite of advanced statistical analysis tools, designed to analyze the testing results quickly and accurately. Finally, J750EX is backed by the most comprehensive, cost-effective support services available, ensuring continued reliability of the asset throughout its use. TERADYNE J750 EX is a valuable final test solution, delivering the speed, accuracy and reliability that is needed to succeed in today's demanding production environments. The model's easy integration and advanced features make it an attractive choice for equipment designers and production engineers. With its superior flexibility and reliable performance, TERADYNE J750EX remains a leading final test option for a broad range of applications.