Used TERADYNE J750 EX #9238310 for sale

TERADYNE J750 EX is a high-production final test platform that is capable of testing a variety of electronic devices such as PCs, tablets and mobile phones. It offers superior test coverage, reliability and speed through its innovative design. TERADYNE J750EX is built upon TERADYNE industry-leading test platform, which includes many flexible and powerful features. The equipment utilizes advanced hardware, software and test algorithms to maximize test coverage and throughput. It also integrates with a multitude of test handlers and interfaces for superior device telemetry and analysis. J 750 EX utilizes a patented FlexTetrix system that is able to quickly configure and optimize test structures for large or small devices. This allows for testing of complex, multi-functional boards with greater flexibility and accuracy. This is further enhanced with the use of proprietary TERADYNE TestFlex software, which provides a broad test library of over 50,000 tests. J750 EX can test multiple devices simultaneously across varying hardware, plus it has a parallel test architecture that can process tests simultaneously, greatly boosting throughput. This platform has a wide range of test voltage capabilities with up to 10V, while its multi-segment matrix switching ensures the optimal application of test stimuli and sensors at all times. The entire unit is controlled by the superior TERADYNE KAYA test programmable test executive. This software suite provides a user-friendly and intuitive interface, with powerful features that allow users to rapidly create and modify test programs for any specific application. TERADYNE J 750 EX gives users the power to process a variety of DPCO, DIP and Vectoring tests at the same time, providing high levels of throughput and accuracy. Its built-in data mining capabilities can quickly identify root causes of failure and provide high yield data for improved analysis. Overall, J750EX is a high-end, high-quality and high-performance machine for final test applications. It supports many standards, including ICT and FCT, and its advanced test algorithms, built-in data mining capabilities and high throughput make it an ideal choice for any test and production environment.