Used TERADYNE J750 EX #9252389 for sale

TERADYNE J750 EX is a fully automated, high throughput final test equipment designed to streamline the testing and production processes of electronic products. With a maximum test head capacity of 6 industry-standard Test Access Points (TAPs), TERADYNE J750EX offers test rates of up to 720,000 test points per hour in a highly efficient package. J 750 EX hardware system consists of several distinct components. First is the multi-level Chassis unit, designed to house the unit's components. The chassis also contains a low-voltage, high-power output supply which is used to power peripherals, and an ultrahigh voltage (UHV) power supply that is suitable for testing at very low power levels. Next on this list is the Test Platform module, a modular platform featuring test adapters, equipment for fixturing, and high-speed data acquisition interfaces. Finally, the machine also includes a Multi-Test Controller (MTC) tool that provides control over all of the asset's test activities. J750EX software package is designed to facilitate efficient data collection and analysis. The control platform features a powerful graphical user interface (GUI) and a variety of automated test tools to meet any testing needs. Additionally, the software provides the ability to interconnect with other TERADYNE systems, allowing engineers to gain access to critical data from any location. The model is capable of performing various tests depending on the requirements. It can conduct in-circuit tests, boundary scan tests, and functional tests, as well as "burn-in" tests which are designed to ensure that products are ready for the production line. J750 EX can also provide as many as eight digital lines and twenty four analog lines of testing port capabilities, providing flexibility and compatibility with multiple test protocols. Overall, TERADYNE J 750 EX represents a powerful, fully-integrated test equipment for production-level final testing in both industrial and consumer electronics. The system is capable of quickly and effectively confirming quality and performance of electronic products, and its modular design and variable test protocol makes it a highly cost effective and reliable solution.