Used TERADYNE J750 EX #9255223 for sale

TERADYNE J750 EX is a fully automated final test equipment made for high volume applications. It has modular test configurations that enable it to test a range of products, from consumer electronics to automotive applications. The system is comprised of a base unit and up to four test cells, each containing multiple ATE instruments, such as DLP, PCBA, and Final Test specialized to meet all the testing needs of the customer. The main components of TERADYNE J750 EXare its Bed of Nails (BoN) tester, Memory and Programmers. BoN is used to test large and complex boards by creating an array of multiple point-to-point connections between board nodes, pins, and components. Memory and Programmers are used to program, read, and verify unit memory, among other functions. These ATE instruments are powered by the J750's high-performance inspection platforms, control software, and communication networks, which enable rapid transfer of test data to automated analysis and consolidation. TERADYNE J750EX is calibrated and continuously monitored through its firmware update and diagnostics utilities. The machine is also equipped with J750 Software (JS), a Windows-based customizable software developed to manage data and test flow. This software enables quick integration between test cells, easy access to results, and reliable data storage and retrieval. Data management and analysis are simplified through Automatic Instrument Adjustment (AIA) algorithms, which helps to keep calibration and test uniform. J 750 EX provides a clean and organized GUI, making it user-friendly and easy to navigate. In summary, TERADYNE J 750 EX is a powerful and reliable automated test tool that offers expansive capabilities for design, programming, and manufacturing tests. With its modular internal designs and high-performance ATE instruments, it provides accurate and effective testing of board level components and assemblies. Data management is simplified with its Windows-based JS Software, making it a great choice for high-volume test applications.