Used TERADYNE J750 EX #9272874 for sale

TERADYNE J750 EX is a next-generation final test equipment designed to deliver superior accuracy, performance, and scalability in dynamic wafer-level testing. Combining advanced automation and test capability, TERADYNE J750EX enables the testing process to be completed with minimal manual intervention. J 750 EX platform is designed to provide an optimal enclosure for semiconductor package test systems. By utilizing an advanced real-time controller and open design architecture, it is able to perform test execution, job control, and probe card selection independently, resulting in greater test coverage with user-configured test suites. An integrated wafer-level test solution, the system utilizes the latest in test methodologies such as logic vector and in-circuit testing to address the challenging requirements of both mobile and high performance devices. J750EX offers accurate test results with a wide range of applications from the most simple to the most advanced microprocessors. The unit is capable of performing test applications ranging from simple memory testing to complex device characterization and yield analysis functions. It supports the latest digital and analog interface standards, as well as a broad range of materials and device packages. Integration of multiple tester configurations with varying pin count and flexibility requirements is simplified with the advanced configuration machine. Highly efficient, the tool's high-efficiency cooling architecture reduces test times and energy costs. TERADYNE J 750 EX features an adaptive test control asset that monitors condition-based parameters such as temperature, humidity, and other environmental parameters to ensure test accuracy and repeatability. Special interfaces allow for direct control of complex application development tools, and can enable connection with external equipment such as automatic wafer prober and corporate or factory networks. Capable of testing over 9 million devices within a day, the model offers approximately 400 test sites and 300 test resources per test equipment. J750 EX is designed to significantly boost test throughput, accuracy, and yields. Developed to meet the needs of modern engineering teams, the system offers increased levels of integration, flexibility, scalability, and productivity. With its advanced automation and test capabilities, TERADYNE J750 EX can provide significant cost savings and enhanced product quality.