Used TERADYNE J750 EX #9311622 for sale
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ID: 9311622
Tester
Test head size: 1024 Channels
Channel board: 512 Channels
Slot / Subslot / Type / Revision
-1 / Sli / 239-624-00 / 1251-A
0 / Channel / 239-700-04 / 1419-B
0 / Terminator / 239-701-50 / 0838-A
1 / Channel / 239-700-04 / 1419-B
1 / Terminator / 239-701-50 / 0838-A
2 / Channel / 239-700-04 / 1419-B
2 / Terminator / 239-701-50 / 0838-A
3 / Channel / 239-700-04 / 1419-B
3 / Terminator / 239-701-50 / 0838-A
4 / Channel / 239-700-04 / 1419-B
4 / Terminator / 239-701-50 / 0838-A
5 / Channel / 239-700-04 / 1419-B
5 / Terminator / 239-701-50 / 0838-A
6 / Channel / 239-700-04 / 1419-B
6 / Terminator / 239-701-50 / 0838-A
7 / Channel / 239-700-04 / 1419-B
7 / Terminator / 239-701-50 / 0838-A
18 / CUB / 239-020-09 / 1423-H
22 / DPS / 239-016-06 / 1414-F
23 / DPS / 239-016-06 / 1414-F.
TERADYNE J750 EX is a high-performance automatic test equipment designed for "final test" of advanced electronic devices. It is based on TERADYNE industry-proven, flexible J750 platform. The system offers a combination of speed, precision, versatility and reliability in a compact footprint. Designed to meet the requirements of a broad range of semiconductor and other electronic device manufacturers, TERADYNE J750EX is capable of high-volume production testing and characterization of a variety of devices including DRAMs, Flash memory, ROMs, MCUs, CPLDs, discretes and micro-controllers. Utilizing a patented, laser-based architecture, the unit employs a scalable, multiport machine configuration and multiple data buses. J 750 EX offers high-speed capabilities, with the fastest dry wafer throughput in the industry. Its advanced 2-piece test module design allows high-density pin densities up to 400 pins per inch on both sides of the device simultaneously and its integrated high-voltage design has the flexibility to support multiple voltage levels simultaneously. The tool includes a wide range of integrated modules such as MicroScope modulated voltage networks, microwave frequency test modules, flex probes, engineered test module systems and a variety of test adapters. It also offers an extensive range of programming options, including remote programming via its advanced Network CommandCenter (NCC) software, ProCOM database support, and a variety of standardized programming languages. J750EX includes powerful diagnostics for automated root cause issue analysis and repair. Its proprietary SCRIBE software suite offers a comprehensive set of diagnostics diagnostics, along with real-time graphical error detection and analysis. An integrated data analysis package allows statistical analysis and reporting of performance data, to allow for process improvement. J750 EX comes with a flexible, configurable asset architecture, enabling it to easily customize to customer requirements, making it an ideal solution for today's demanding test requirements. The addition of its automated tooling capabilities means it's an ideal solution for multi-axis, multi-probe automotive and medical device testing. The model offers an unmatched combination of features, making it the market leader for test systems. The combination of advanced technologies, equipment performance, diagnostics, programming, and customizable architectures make TERADYNE J 750 EX the ideal system for electronics manufacturers.
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