Used TERADYNE J750 #293639895 for sale

TERADYNE J750
Manufacturer
TERADYNE
Model
J750
ID: 293639895
RF Tester.
TERADYNE J750 is a high-performance, advanced final test equipment that helps make the production of complex semiconductor devices easier and more efficient. It is a complete solution for online, in-line, or manual wafer-level testing, providing high levels of measurement accuracy with fast and flexible test application. TERADYNE J 750 utilizes the latest technology in alignment, scan, and test-card adjustment, offering high-accuracy alignment capabilities. This system offers quick and easy insertion, termination, and interconnect during testing for simpler wafer loading, sorting, and test preparation. Additionally, it is designed with modular and scalable software and hardware platforms that help to meet the individual requirements of each customer. J750 is also capable of handling up to four Wafer Probes and one high-speed pin-probe, allowing it to support a variety of test types. Its timer, multi-site independent measurement, and multi-test capability enable faster data acquisition and analysis. The unit is equipped with top-of-the-line vision systems and advanced image processing to ensure accurate results. J 750 includes advanced prober control, multiple test-head control, and host-to-card communication. It also has a variety of motion control features like jog speed control, scan table motion, and servo position control. A Graphical User Interface (GUI) allows users to control and monitor the machine, as well as configure settings and review measurement results. For test data management, TERADYNE J750 is capable of storing test results onto a variety of output devices, such as disk drives and digital recorder cards. This tool is also compatible with industry-standard protocols and communications, ensuring easy integration into a variety of plant-wide networks and asset environments. Overall, TERADYNE J 750 is a versatile and powerful model that is designed to meet the needs of a variety of customers. Its ability to configure and adapt quickly to changing test and assembly requirements is ideal for semiconductor device manufacturing and testing.
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