Used TERADYNE J750 #9167072 for sale

TERADYNE J750 Final Test equipment is a next-generation test and inspection platform designed to provide superior test coverage and enhance device yield for complex semiconductor devices. It is a scalable, high-throughput tester with a small footprint that is ideal for testing today's small form factor packages. TERADYNE J 750 is ideal for testing a wide range of applications and offers a predictable, low risk solution for testing low-pin count through high-pin count semiconductor devices. The system utilizes an optimized architecture to achieve higher test accuracy, lower test costs and increased test coverage, resulting in an increase in device yield. J750 features a high-speed digital signal processor (DSP) chipset for rapidly processing test patterns for high pin count devices. The unit utilizes a real-time test sequencing and control machine that is designed to support advanced test algorithms and robust diagnostics, allowing users to leverage the latest test innovations. The advanced closed-loop control and measurement tool ensures fast and accurate test results. J 750 provides the flexibility to easily integrate custom test solutions into the tester architecture, allowing users to increase their test coverage even further. An intuitive and easy-to-use graphical user interface simplifies the debugging and troubleshooting processes, helping users to increase productivity. Also, an extensive library of custom device drivers are available for the asset, allowing for quick and seamless integration of devices into the test model. TERADYNE J750 Final Test Equipment is a powerful, reliable and cost effective test and inspection solution. Its advanced architecture and capabilities make it the ideal system for testing today's highly complex semiconductor devices, enabling users to maximize device yield with minimal risk.