Used TERADYNE J750 #9179290 for sale

TERADYNE J750 is a next generation final test equipment for both production and burn-in processes that ensures high quality results for complex electronic devices. Featuring four test modules, TERADYNE J 750 can automate single or complex functions to reduce errors and improve product quality. J750's integrated test architecture allows it to simultaneously measure and evaluate a wide array of test functions. The system can measure up to 4800 electrodes per module and is designed to operate with a wide range of device types and applications. The four test modules integrate high-speed memory and logic tests, in-unit tests and comprehensive testing of device pins, nets, bonds and pins. The four-module configuration allows for easy deployment in production lines and the machine can be customized for specialized applications. J 750 features integrated circuit (IC) handler management that allows for the automation of test data acquisition, evaluation and transport. The IC Handler Management module provides powerful tools to control the test process, including access to IC Handler logs, IC Handler queue management, scheduling, and IC Handler management. IC Handler management also helps reduce test time and can be integrated with other TERADYNE test modules to provide a complete test solution. TERADYNE J750 offers enhanced debugging capabilities with its Programmable Logic Design (PLD) debug feature. The PLD debug features provides a graphical environment that can display up to 16 devices. The graphical environment allows for users to troubleshoot PLD design faults quickly and easily. It is also able to consistently measure and report device parameters for multiple devices for further debugging purposes. TERADYNE J 750 also offers advanced test coverage, which helps to reduce test times and improve quality control. J750 is able to perform more than 650,000 concurrent tests per tool, providing detailed test coverage for a wide range of electronic devices. With its high-speed probe cards, J 750 maximizes testing accuracy and throughput. TERADYNE J750 is a next generation, high-performance test solution that provides efficient, reliable testing and improved product quality. Featuring four test modules and integrated circuit handler management, TERADYNE J 750 offers a high degree of flexibility, ensuring maximum test coverage and accuracy, while reducing costs and improving quality control.