Used TERADYNE J750 #9202386 for sale

TERADYNE J750 is an advanced final test equipment used in various industries. TERADYNE J 750 features include a dual-lane architecture which allows for huge testing throughput, ranging from 200 to 800 units per hour per site. The system offers a comprehensive set of test solutions designed to test the most complex circuits and devices. J750's multi-processor architecture allows it to execute logic and memory tests within a given period. J 750 utilizes an advanced software platform to control test parameters such as programming times and test modes. The unit also has proprietary correlation testing, which uses stringent algorithms to identify any potential machine anomalies. This ensures that TERADYNE J750 accurately finds defects that would otherwise be missed. TERADYNE J 750 is also equipped with advanced failure analysis capabilities. This tool can provide information about the location of each failure in the tested device, and provide in-depth analysis of each defect. J750 uses state-of-the-art hardware, such as the high-speed interconnect, which allows it to reliably test devices that have multiple attachment points, as well as devices that have a very high number of test points. The asset also features enhanced fault coverage, as it uses a combination of digital and analog patterns to increase the fault coverage, ensuring that all devices are fully tested. In terms of reliability, J 750 is designed to aim for high maturity and reduces the need for re-alignment or calibration due to constant motion. The model also features an automated recognition mechanism, so that it can easily identify new models of devices, reducing the need for periodic source code maintenance. Furthermore, the equipment also includes an advanced defect analysis software platform with detailed defect reports, so that remediation and troubleshooting can occur more quickly. Overall, TERADYNE J750 provides a comprehensive solution for device testing, providing fast and reliable testing results with improved test coverage and detailed defect analysis. This system is suitable for use in the most demanding of environments and offers the highest level of test coverage available today.