Used TERADYNE J750 #9215238 for sale

TERADYNE J750 Final Test Equipment is a versatile and reliable test solution platform designed for device testing in both high-volume production environments and R&D laboratories. The system uses an industry-recognized scan test interface to allow engineers to program tests to the device under test (DUT) quickly and accurately. This unit is built to provide both affordability and advanced performance for a wide variety of test and debugging tasks. TERADYNE J 750 offers a variety of tester hardware hardware configurations and test technology options. This includes a choice between FPGA-based vector generation, deterministic timing control, and modular test architecture with dedicated ATE components. It also offers both airwafer and contact handler options for testing devices up to 300mm in size. Additionally, J750 boasts a dynamic test suite, which enables engineers to quickly and easily reprogram the test patterns even while in high-volume production. J 750 also delivers a powerful assessment of the performance of devices under test. This includes the ability to test waveforms with up to 600 MHz sample rates, and apply powerful algorithms to interpret them down to the component level. TERADYNE J750 also offers built-in advanced RF test capabilities, with integrated RF measurement systems and a choice of vector signal analyzers, signal analyzers, and signal generators. Finally, TERADYNE J 750 offers a wide range of connectivity and test tools, such as J750 PowerMeter for power measurement, MIPI probe for high-speed and low-power interface testing, and high-reliability, high-performance probes and sockets for debugging. This flexibility allows for quick and easy installations, while offering an outstanding yield. J 750 Final Test Machine is a powerful and versatile solution for testing and debugging a wide variety of electronic components, modules, and systems. Its capabilities can be tailored to meet specific needs, and its scalability ensures that it can adapt to production systems of various sizes. Additionally, its intuitive scanning interface, powerful assessment tools, and robust support makes it an ideal choice for performing reliable device testing in both high-volume production environments and R&D laboratories.