Used TERADYNE J750 #9228119 for sale

TERADYNE J750 is an advanced, automated and efficient final test equipment capable of testing a very wide variety of products, from microcontrollers and memory components to digital displays and high speed logic. TERADYNE J 750 is designed to provide high throughput, quick cycle times and low test costs, enabling cost-effective testing of a broad range of electronic devices. It is also very flexible, allowing the test customer to easily add and delete tests of their specific devices. The system is capable of performing functional tests, digital functional tests, parametric measurements, analog functional tests, interconnects tests and fault isolation in a very short period of time. J750 features a reliable platform that reduces downtime and increases throughput for today's high volume environments. Its distributed computing architecture allows for scaling up with additional test modules, maximizing throughput and respond time following user's requirements. The unit's scalability also allows customer to select from number of configurations that suit their testing needs and budgetary constraints. J 750 combines the advanced technology and modularity of today's automated test systems with interactive and user-friendly test programming and user interfaces. The systems hardware and software were designed with Standard Test Programming Language (STPL) and Standard Interactive Debugging Language (SIDL) that permit the quick and easy automation of tests for different types of devices, creating a flexible and economical environment for new and existing test requirements, guaranteeing that the customer gets the most out of the test machine, both from an application and cost standpoint. TERADYNE J750 also offers a wide range of fault isolation and debug tools, allowing the user to more rapidly identify and repair potential faults. These debug capabilities include full probe connectivity, comprehensive bit pattern visualization, sophisticated fault isolation algorithms and detailed functional Troubleshooting capability. The tool also provides an enhanced automation package and allows users to Seamlessly manage hundreds of DUTs with one test engineer, by using focused scripts and maximizing asset utilization. This package also includes TOP Fail Feature, which is a powerful features tracking model that summarizes test results, enhancing the throughput and productivity of the equipment. TERADYNE J 750 makes it easy to integrate in-circuit test and provide cost-effectively test of mixed technologies. The system easily connects to other TERADYNE systems or third-party in-circuit testers, allowing customers to seamlessly test rigid, flex and BGA boards with the same platform. It also supports the testing of large boards with a minimal amount of dedicated-pin probing. Overall, J750 is a powerful, versatile and reliable final test unit that has been designed to provide a robust and cost efficient solution for today's complex testing environments. It combines advanced technology, flexible scalability and intuitive software to deliver quick and efficient testing for a wide range of products. The machine is well-suited for high-volume test environments and for the customers who need a reliable and future-proof testing solution.