Used TERADYNE J750 #9231472 for sale

TERADYNE J750 is a final test equipment used to test and inspect a variety of integrated circuit (IC) devices, ranging from large to very small. It is able to test multiple devices with its large testing area, while still remaining compact in size. The system features a number of integrated technologies to offer its customers the best testing results possible. TERADYNE J 750 integrates a combination of multiple test sites, advanced VisionPro programming software, and high-speed laser encoding systems. These components allow for faster testing times and higher quality diagnostics. The integrated digital signal processing (DSP) also provides advanced triggering, data capture, and analysis capabilities. J750 also features a number of features designed to increase unit accuracy and production yields. It comes with an automatic test program generation machine which simplifies the programming process. This computer-generated test suite contains optimized test vectors and conditionals that help to generate higher diagnostic accuracy and increase yields. Additionally, the tool has in-circuit and built-in self-test capabilities that can detect any errors before the device is released for use. J 750 also supports a variety of test strategies such as parametric, functional, and long-duration. It can also provide simultaneous wafer and packaged device test strategies. Its advanced programming software makes it easy to interface with test program devices and customize testing strategies as needed. TERADYNE J750 also features a patented Sweep Diagnostics algorithm that can quickly analyze test results, helping to reduce test time and increase yields. Additionally, this asset offers a number of power-saving capabilities. Its advanced cooling model allows for greater space efficiency and reduced power consumption. The fans are intelligent, with multiple speed settings that ensure the cooling equipment does not over consume valuable power when idle. Overall, TERADYNE J 750 is an excellent solution for final test and inspection of a wide range of IC devices. It offers a combination of integrated technologies, advanced programming software, and power-saving capabilities to give users the highest quality testing results possible. With its integrated test sites, digital signal processing, and test program generation, J750 is a powerful and reliable system that can help any IC device manufacturer save time, energy, and money.