Used TERADYNE J750 #9236117 for sale

TERADYNE J750 is an advanced Final Test equipment used for testing the quality and reliability of manufactured die, packages, and modules in the semiconductor industry. It is used to detect faults in a chip, package, or module that otherwise may have gone unnoticed. TERADYNE J 750 is capable of testing a wide variety of die, both packaged and unpackaged. The system features three different test methods: functional test, parametric test, and optical test. The functional test measures the functionality of the device against pre-defined criteria to ensure the device is performing correctly. The parametric test measures the performance within the parametric range of the device, such as voltage, current, and power, to ensure the device is functioning properly. The optical test utilizes optical inspection tools to detect any physical anomalies that may be present on the device. J750 has two high-speed matrix-driving technologies: a high-speed parallel test architecture and a Serial Substrate Scoreboard architecture. The parallel test architecture is capable of testing up to 960 devices per second while the Serial Substrate Scoreboard architecture is capable of testing up to 7.2 billion devices per second. This incredibly fast testing speeds ensure that J 750 can quickly and accurately detect any potential faults in a device. The unit can also perform basic diagnostics on devices to determine the cause of any faults. This is done by injecting voltage or current and then observing the results. The machine also has an integrated manufacturing interface which enables it to be easily connected to the production line for automated testing. TERADYNE J750 is an advanced and robust tool with an exceptionally large shelf life. The asset is also extremely reliable and capable of testing up to 40 million devices consistently with no need for maintenance. This model is an ideal choice for semiconductor manufacturers due to its ability to quickly and accurately detect faults with minimal effort and downtime.