Used TERADYNE J750 #9240602 for sale

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Manufacturer
TERADYNE
Model
J750
ID: 9240602
Tester Test head type: 512 Pin test head Configuration: Channel board (P/N: 239-026-00) Channel board (P/N: 239-026-03) CUB (P/N: 239-020-06) CTO (P/N: 239-029-00) DPS (P/N: 239-016-03) Includes: HEWLETT-PACKARD Z800 PC Workstation BASLER ELECTRIC Isolation transformer (P/N: 9325500100) ESMO Ikarus Standard universal test head manipulator (P/N: 2310.00.97.0001) Missing EMI Dust cover Does not include: Calibration DIB Diagnostic DIB.
TERADYNE J750 is a Final Test Equipment that is a powerful, high-speed, multi-site, automated test-equipment system for testing a variety of electronic products. The unit can handle up to 128 test sites in a single test frame and can support devices ranging from chip-to-board prototypes through to high-volume, high-pin-count products. It is a scalable, flexible and cost-effective solution for a wide range of test challenges and environments. TERADYNE J 750 is designed to accommodate a wide array of interface and interface-type combinations, allowing it to be tailored to meet individual test requirements. The machine supports and efficiently processes a wide range of test procedures, including parametric and functional tests, memory tests, statistical analysis, device characterization and much more. High-speed data transfer and simultaneous test execution are enabled by its innovative on-board processor technology. J750 also offers a comprehensive package of software support tools, facilitating an easy transition from manual to automated test. The device-setup and programming applications provide an intuitive graphic interface, allowing test engineers to quickly create, verify and debug device configuration settings and test programs. This array of features and functionality allows you to efficiently ramp up device test projects quickly and accurately. The tool also offers a range of expandable components, such as board-level diagnostics, temperature chambers, source-measuring units, power supplies, and RF probing solutions that can be integrated easily into the asset architecture. Moreover, it is compatible with a multitude of competitive and non-competitive test subsystems, ensuring seamless integration with existing test systems. The flexibility of the model allows for multi-site, floor-plan optimization, and improved density usage through 'mix-and-match' of different test sites. Overall, J 750 Final Test Equipment is a robust and versatile test solution with an open architecture and a wide range of customisable options. Its innovative technology and advanced software tools help you to achieve higher productivity and significantly lower total cost of test. TERADYNE J750 offers scalability, expandability, compatibility, flexibility and optimal cost-effectiveness, making it an ideal choice for quality assurance in any complex test environment.
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