Used TERADYNE J750 #9262241 for sale

TERADYNE J750 is a state-of-the-art automatic test equipment for final test operations. It supports high accuracy and high throughput for a wide range of applications, including microprocessors, memory, embedded systems, analog, and mixed signal devices. TERADYNE J 750's basic configuration includes a master ATE controller, contactor bank, power distribution board, automated probe manipulation system and a generic fixture interface. J750 provides an expandable unit design which is suitable for a wide range of devices. It can be optimised for specific options such as defect isolation, re-test, and device programming. The machine employs advanced algorithms for fast test execution and reduce defect test time. In addition, the customisable testing software can be used to configure the tool for specialised applications and tests. J 750 prototype has a designed-in fault detection capability with real-time analysis to diagnose problems and improve test accuracy. Furthermore, the asset ensures high-speed testing with sophisticated algorithms that are designed to maximise throughput and lower total test costs. The instrument's accuracy and rate-limiting features provide excellent yield and test coverage, while its multiple model configurations make it reliable and flexible. Basically, it is an integrated solution to fully automated test operations that offers extensive capabilities over a wide range of applications and test conditions. TERADYNE J750 is perfect for volume manufacturing, giving users a large selection of options to further enhance its capabilities. With its powerful and open architecture, TERADYNE J 750 transforms test and measurement throughout a device's design and manufacturing process. Its intuitive, modern user interface also makes it easier to use. In conclusion, J750 is a highly sophisticated final test equipment with impressive capabilities, perfect for volume manufacturing. Its flexible architecture, which includes variable speed operations and open-architecture, makes it ideal for a range of devices, from microprocessors to mixed signal devices. In addition, its powerful test suites, accuracy and rate-limiting features ensure excellent yield and test coverage.