Used TERADYNE J750 #9262267 for sale

TERADYNE J750 is a highly sophisticated final test equipment designed to improve the test and validation quality of complex components. It is an automated, continuous testing system that provides unsurpassed fault coverage and test speeds for a wide variety of high end components, such as microprocessors, digital signal processors, ASICs, and microcontrollers. The unit is based on widely deployed, proven test technologies, such as digital pin electronics, simultaneous multisite, digital pattern generation, direct data acquisition and precise programmable voltage sources. The digital pin electronics employed by TERADYNE J 750 are capable of testing all digital devices. The pin electronics offer high speed signal switching and switching accuracy up to 10ns at 500MHz, with the capability of delivering ideal waveforms for signal integrity, reduced crosstalk, and impedance matching for advanced signal quality applications. The simultaneous multi-site mode permits parallel testing, enabling the machine to test at multiple sites simultaneously. This testing mode increases throughput and, ultimately reduces time to market. The test tool can also perform pattern generation and testing in both static and dynamic modes. In static mode, the pattern generator can produce user-defined static waveforms that can be used to control the device under test. This waveform will remain stable until a reset command is issued, making it ideal for some reliability tests or those that require repetitive waveforms. In dynamic mode, pseudo-random patterns or complex waveforms can be produced and used to configures the pins and circuits. In addition, J750 includes an extensive selection of on-board instruments for current and voltage measurements and for thermal test procedures. These instruments are ideal for measuring parameters such as voltages, currents, temperatures, and waveforms. Such measurements are in turn used to compare expected values during the test process. This advanced measurement scripting capability generates better models for thermal and electrical stress tests, improving the accuracy of the process. Finally the asset also boasts three contactless test probes, which are connected to the test head and provide a reliable, high-accuracy connection between the device under test and automated test equipment. This ensures that all components of the test model remain stable while the device is tested and handled. Furthermore, the high-speed CCD camera provides fast frame capture, along with simultaneous vision analysis, without compromising equipment throughput. Overall, J 750 is an incredibly efficient and reliable final test system that can dramatically improve components testing and validation accuracy. It offers a great range of features and functionality, including advanced pin electronics, simultaneous multi-site testing, pattern generation, an extensive array of measurement instruments, contactless test probes, and a high-speed CCD camera. This unit offers faster product testing, better fault coverage and reduced time to market.