Used TERADYNE J750 #9262430 for sale

Manufacturer
TERADYNE
Model
J750
ID: 9262430
Testers Small test head 512 Channels LVM 16M (3) DPS MTO XW8400 Workstation 2001-2004 vintage.
TERADYNE J750 is a Final Test equipment designed for maximum test coverage at the lowest cost of test. It has a modular, scalable architecture that allows for both high capacity and flexibility for testing a variety of products. TERADYNE J 750 includes an easy-to-use Quantum Machine Interface (QMI) software that enables users to manage test solutions quickly and easily. J750 is a high-speed, high-throughput test system capable of testing high content devices at rates of up to 160 megaclocks per second (MHz). It has an optional rack unit that enables testing in a large footprint. The automation machine provides an integrated platform for test development that includes a high-speed test mode capable of running pin-to-pin tests up to 6.5 gigahertz. It also includes advanced thermal control, fast pulse programming, plus configurable power and current limit settings. This allows the automatic adaptation of J 750 for the test applications. The flexible, configurable TERADYNE J750 is designed with testers in mind and has a wide variety of test options, from single site to multiple sites, from hundreds of thousands of tests to millions. It also supports standard test development tools and third-party software platforms. The QMI software allows the user to create custom tests, view test data, and verify and authenticate devices. TERADYNE J 750 includes an Open Test Tool (OTS) which provides users with the ability to change local test programs and analyze results quickly, with more flexibility than traditional test solutions. The OTS also supports on-the-fly test set up and re-configuration. The intuitive, ergonomic design of J750 reduces workflow interruptions and minimizes the time-to-market required for test and debug process. The multiple features of J 750 simplify the process of managing test solutions, improving the overall efficiency and effectiveness. TERADYNE J750 can also be integrated with existing Bluetooth and WiFi networks, providing more options for device characterization techniques. It is expandable with stackable modules to meet the requirements of large test volumes. With a wide range of direct connectivity and a variety of digital I/O capabilities, TERADYNE J 750 is suitable for a number of different test environments. J750 is the ideal final test asset, providing a single-site solution, allowing users to quickly and flexibly measure and test multiple devices, without compromising on performance or quality.
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